Author

Jai Prakash Gautam

Observed names: Gautam J. P., Gautam, Jaiprakash, J Gautam, J. Gautam, J. P. Gautam, J. Prakash Gautam, J.P Gautam, J.P. Gautam, JP Gautam, Jai Gautam, Jaiprakash Gautam
ORCID: 0000-0001-6275-413X
Observed ORCID: 0000-0001-6275-413X
OpenAlex ID: A5050314313
2018 · Vamsi Krishna Rentala, Phani Mylavarapu, et al. · Ultrasonics · 43
2021 · Mohd Aqeel, S.M Shariff, et al. · Materials and Manufacturing Processes · 26
2021 · Vamsi Krishna Rentala, Phani Mylavarapu, et al. · Journal of Nondestructive Evaluation · 21
2022 · K. Thirunaukkarasu, Md Abu Taher, et al. · Optics & Laser Technology · 16
2022 · G. Muthukumaran, Arun Kumar Rai, et al. · Journal of Materials Engineering and Performance · 15
2007 · Jai Gautam, Roumen H. Petrov, et al. · Materials science forum · 15
2003 · R. C. Gupta, J. P. Gautam · ISIJ International · 15
2018 · R.V.S.M. Ramakrishna, K. Bhanu Sankara Rao, et al. · Materials Today Proceedings · 14
2012 · Edgar Gomes, Kim Verbeken, et al. · Materials Science and Engineering A · 14
2012 · Jai Gautam, Alexis G. Miroux, et al. · Materials science forum · 7
2025 · Nitin Chaudhary, Chavan Akash Naik, et al. · Beilstein Journal of Nanotechnology · 6
2022 · S. Janakiram, P. Sudharshan Phani, et al. · Materials Characterization · 6
2019 · Amit Singh, I. Balasundar, et al. · Procedia Structural Integrity · 6
2003 · R. C. Gupta, J. P. Gautam, et al. · ISIJ International · 5
2025 · Naveen Manhar Chavan, U. Vamshi, et al. · Journal of Alloys and Compounds · 4
2019 · S. Janakiram, J. Prakash Gautam, et al. · Diffusion foundations · 4
2019 · J. Prakash Gautam, A. Miroux, et al. · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum · 4
2019 · V K Rentala, P Mylavarapu, et al. · Insight - Non-Destructive Testing and Condition Monitoring · 4
Works count: 55
Citation count: 393
H-index: 13
I10-index: 13
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