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E. Yee Kin Choi
Institutions:
Institut de Physique de Rennes,
Université Rennes 1,
Université de Rennes
Observed institutions:
Institut de Physique de Rennes,
Université Rennes 1,
Université de Rennes
OpenAlex ID:
A5050695724
Statistical analysis of voltage from constriction to micro-arc values during aging by fretting
2015
·
S. El Mossouess
, E. Yee Kin Choi
, et al.
·
IEEE Holm Conference on Electrical Contacts (HOLM)
·
4
Optimisation of material erosion and welding performance by metal oxides and magnetic particles
2014
·
E. Yee Kin Choi
, Erwann Carvou
, et al.
·
4
Particle Size Determination in Electrical Arcs Using X-Ray Scattering
2013
·
E. Carvou
, J. L. Le Garrec
, et al.
·
IEEE Holm Conference on Electrical Contacts (HOLM)
·
2
Characterization of Nanometer-Sized Particles
1990
·
E. Yee Kin Choi
·
Purdue e-Pubs (Purdue University System)
·
2
Particle size determination in electrical arcs with Ag and AgSnO2 electrodes using X-ray scattering
2015
·
E. Carvou
, J.L. Le Garrec
, et al.
·
IEEE Holm Conference on Electrical Contacts (HOLM)
·
1
PDF
Contact voltage analysis for degraded contact surfaces by power arcing phenomenon
2014
·
E. Yee Kin Choi
, E. Carvou
, et al.
·
IEEE Holm Conference on Electrical Contacts (HOLM)
·
1
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Works count:
6
Citation count:
14
H-index:
2
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