Author

Robert Schwerz

Observed names: R. Schwerz, Schwerz, R., Schwerz, Robert, Schwerz, Robert 1983-
ORCID: 0000-0002-7954-3811
Observed ORCID: 0000-0002-7954-3811
OpenAlex ID: A5054331469
2018 · R. Schwerz, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 13
2014 · R. Schwerz, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 12
2011 · Robert Schwerz, Sebastian Meyer, et al. · International Spring Seminar on Electronics Technology · 11
2018 · A. Yuile, R. Schwerz, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 9
2016 · R. Schwerz, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 7
2013 · R. Schwerz, B. Boehme, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 7
2013 · R. Schwerz, K. Meier, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 7
2022 · Rika Berger, Robert Schwerz, et al. · Microelectronics Reliability · 4
2020 · R. Schwerz, R. Metasch, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 4
2019 · R. Metasch, R. Schwerz, et al. · European Microelectronics and Packaging Conference · 4
2012 · Robert Schwerz, Mike Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 4
2024 · R. Schwerz, M. Roellig · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 3
2018 · Robert Schwerz, Rene Metasch, et al. · Electronic System-Integration Technology Conference (ESTC) · 3
2015 · R. Metasch, R. Schwerz, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 3
2013 · Sergii Osmolovskyi, Robert Schwerz, et al. · International Spring Seminar on Electronics Technology · 3
2011 · Lars Schubert, R. Schwerz, et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 3
2022 · A. Clausner, S. Schlipf, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 2
2023 · M. Roellig, R. Schwerz, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 1
2022 · R. Metasch, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 1
2021 · Rika Berger, Robert Schwerz, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 1
2011 · Sebastian Meyer, Rene Metasch, et al. · IEEE Electronics Packaging Technology Conference (EPTC) · 1
2026 · Kilian Tschöke, Georg Lautenschläger, et al. · e-Journal of Nondestructive Testing
2026 · Robert Schwerz, Mike Röllig · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
2025 · R. Schwerz, M. Roellig · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
2021 · R. Schwerz, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Works count: 37
Citation count: 106
H-index: 7
I10-index: 3
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