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Mesfin Seid Ibrahim

Observed names: MS Ibrahim, Mesfin Ibrahim, Mesfin S. Ibrahim
ORCID: 0000-0001-5202-4539
Observed ORCID: 0000-0001-5202-4539
OpenAlex ID: A5054994988
Machine Learning and Digital Twin Driven Diagnostics and Prognostics of Light‐Emitting Diodes
2020 · Mesfin Seid Ibrahim, Jiajie Fan, et al. · Laser & Photonics Review · 82
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Lifetime Prediction of Ultraviolet Light-Emitting Diodes Using a Long Short-Term Memory Recurrent Neural Network
2020 · Zhou Jing, Jie Liu, et al. · IEEE Electron Device Letters · 47
Lumen Degradation Lifetime Prediction for High-Power White LEDs Based on the Gamma Process Model
2019 · Mesfin Seid Ibrahim, Jiajie Fan, et al. · IEEE photonics journal · 38
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In-Situ early anomaly detection and remaining useful lifetime prediction for high-power white LEDs with distance and entropy-based long short-term memory recurrent neural networks
2023 · Minzhen Wen, Mesfin Seid Ibrahim, et al. · Expert Systems with Applications · 35
Long-Term Lifetime Prediction of Power MOSFET Devices Based on LSTM and GRU Algorithms
2023 · Mesfin Seid Ibrahim, Waseem Abbas, et al. · Mathematics · 33
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Defect and texture engineering of relaxor thin films for High-Power energy storage applications
2024 · Waseem Abbas, Mesfin Seid Ibrahim, et al. · Chemical Engineering Journal · 31
Bayesian based lifetime prediction for high-power white LEDs
2021 · Mesfin S. Ibrahim, Zhou Jing, et al. · Expert Systems with Applications · 31
System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method
2021 · Mesfin Seid Ibrahim, Jiajie Fan, et al. · Measurement · 29
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A Thin and Low-Inductance 1200 V SiC MOSFET Fan-Out Panel-Level Packaging With Thermal Cycling Reliability Evaluation
2023 · Wei Chen, Jing Jiang, et al. · IEEE Transactions on Electron Devices · 25
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The effect of pre-existing voids on solder reliability at different thermomechanical stress Levels: Experimental assessment
2023 · Abbas Waseem, Mesfin Seid Ibrahim, et al. · Materials & Design · 23
A Gamma process-based degradation testing of silicone encapsulant used in LED packaging
2021 · Jiajie Fan, Ye Chen, et al. · Polymer Testing · 19
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Prognostics of radiation power degradation lifetime for ultraviolet light-emitting diodes using stochastic data-driven models
2021 · Jiajie Fan, Zhou Jing, et al. · Energy and AI · 14
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Junction temperature and luminous flux prediction for white LED array based on electrical-photo-thermal modeling
2024 · Minne Liu, Wenyu Li, et al. · Case Studies in Thermal Engineering · 13
Random Voids Generation and Effect of Thermal Shock Load on Mechanical Reliability of Light-Emitting Diode Flip Chip Solder Joints
2019 · Jiajie Fan, Jie Wu, et al. · Materials · 13
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Precursor Prediction and Early Warning of Power MOSFET Failure Using Machine Learning With Model Uncertainty Considered
2024 · Yuluo Hou, Chang Lu, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 9
Thermal-mechanical-electrical Co-design of Fan-Out Panel-Level SiC MOSFET Packaging with a Multi-objective Optimization Algorithm
2023 · Wei Chen, Xuyang Yan, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 8
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Lifetime Prediction of Ultraviolet Light-emitting Diodes with Accelerated Wiener Degradation Process
2019 · Zhou Jing, Mesfin Seid Ibrahim, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 8
Lumen Maintenance Lifetime Prediction for Phosphor-converted White LEDs with a Wiener Process based Model
2018 · Mesfin Seid Ibrahim, Winco K. C. Yung, et al. · International Conference on Electronic Materials and Packaging · 8
Life cycle assessment of high-power white LEDs for indoor lighting in the context of Hong Kong
2024 · MS Ibrahim, WKC Yung, et al. · Lighting Research & Technology · 4
Evaluation of Temperature-Humidity-Reverse Bias Robustness of 3rd Generation 650V Class 4H-SiC Discrete Power MOSFET Devices
2023 · Muhammad Waseem, Mesfin Seid Ibrahim, et al. · IEEE International Integrated Reliability Workshop final report · 4
Health Monitoring, Machine Learning, and Digital Twin for LED Degradation Analysis
2022 · Mesfin Seid Ibrahim, Zhou Jing, et al. · Springer eBooks · 4
A hybrid degradation modeling of light-emitting diode using permutation entropy and data-driven methods
2021 · Minzhen Wen, Zhou Jing, et al. · International Conference on Electronic Packaging Technology (ICEPT) · 4
Impacts and mitigation strategies of process-induced packaging defects for enhancing reliability of power devices
2026 · Waseem Abbas, Mesfin S. Ibrahim, et al. · Microelectronics Reliability · 3
In-situ anomaly detection for power MOSFET’s degradation based on unsupervised LSTM-Autoencoder
2026 · Shaojian Xie, Mesfin Seid Ibrahim, et al. · IEEE Electronic Components and Technology Conference (ECTC)
Machine learning assisted early anomaly detection of LEDs with spectral power distribution modeling
2023 · Minne Liu, Mesfin S. Ibrahim, et al. · China International Forum on Solid State Lighting & International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)
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Works count: 25
Citation count: 485
H-index: 13
I10-index: 14
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