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F. Perrier
Observed names:
Franck Perrier,
Perrier, F.,
Perrier, Franck
Observed institution:
Sofradir (France)
OpenAlex ID:
A5055437854
Automatic Extraction Methodology for Accurate Measurements of Effective Channel Length on 65-nm MOSFET Technology and Below
2008
·
Dominique Fleury
, Antoine Cros
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
25
Investigation of Electrical Latchup and SEL Mechanisms at Low Temperature for Applications down to 50K
2017
·
A. Al Youssef
, L. Artola
, et al.
·
IEEE Transactions on Nuclear Science
·
20
Single Event Upset Sensitivity of D-Flip Flop of Infrared Image Sensors for Low Temperature Applications Down to 77 K
2015
·
L. Artola
, G. Hubert
, et al.
·
IEEE Transactions on Nuclear Science
·
15
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature
2018
·
Laurent Artola
, Ahmad Youssef
, et al.
·
Sensors
·
9
PDF
Single-Event Transients in Readout Circuitries at Low Temperature Down to 50 K
2017
·
A. Al Youssef
, L. Artola
, et al.
·
IEEE Transactions on Nuclear Science
·
6
Analysis of low temperature on single event Latchup mechanisms by TCAD simulations for applications down to 50K
2016
·
A. Al Youssef
, L. Artola
, et al.
·
European Conference on Radiation and Its Effects on Components and Systems
·
6
Low Temperature Total Dose Irradiation of Transistors for Infrared Applications
2014
·
T. Nuns
, J.-P. David
, et al.
·
IEEE Transactions on Nuclear Science
·
5
Automatic extraction methodology for accurate measurement of effective channel length on 65nm MOSFET technology and below
2007
·
Dominique Fleury
, Antoine Cros
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
5
QWIP infrared detector production line results
2012
·
Michel Runtz
, Franck Perrier
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Étude par simulation TCAD des effets design et température d'un inverseur CMOS sur la sensibilité Latchup
2016
·
Al Youssef, Ahmad
, Artola, Laurent
, et al.
·
HAL
·
1
Space-qualified technologies at LYNRED
2025
·
Nicolas Péré-Laperne
, Samuel Ducret
, et al.
Single Event Effects Analysis in Readout Integrated Circuits at Cryogenic Temperatures
2018
·
Artola, Laurent
, Ducret, S.
, et al.
·
HAL
Radiation Prediction Tool Dedicated to Analyze and Harden by Design readout circuits of photonic ICs
2016
·
Artola, L.
, Ducret, S.
, et al.
·
HAL
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Works count:
13
Citation count:
94
H-index:
6
I10-index:
3
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