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Author

Y Kim

Observed names: Ye-jin Kim, Yeonsoo Kim, Younghun Kim, Youngok Kim
Observed institution: Kwangwoon University
ORCID: 0000-0002-1531-4745
Observed ORCIDs: 0000-0002-1531-4745, 0000-0003-4860-8632
OpenAlex ID: A5055756336
Structural, electrical and optical properties of Si delta-doped Al0.27Ga0.73As/GaAs single quantum wells grown by metalorganic chemical vapour deposition
1994 · T W Kim, Y Kim, et al. · Semiconductor Science and Technology · 3
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MXene-integrated porous carbon sponge for solar thermal storage and thermoelectric generation
2026 · Min Pak, Younghun Kim · Solar Energy · 2
Three-dimensional distribution of roadside airborne/tire-wear particles and implications for pedestrian exposure
2026 · Minseong Kim, Min Pak, et al. · Journal of Hazardous Materials · 1
A Performance-Driven Adaptive Heterogeneous Routing Protocol for ZigBee–BLE Mobile Ad-Hoc Networks
2026 · Junhao Zhou, Chao Sun, et al. · IEEE Access · 1
Thermal Management Impact of Heat Conductive Layers on Ga₂O₃ Schottky Barrier Diodes
2024 · Ye-jin Kim, Geon-hee Lee, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers · 1
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Correcting exposed-water evaporation bias for reliable benchmarking of solar-driven interfacial evaporation
2026 · Jaehwan Hong, Younghun Kim · Desalination
Combined enhancement of adhesion and light-triggered shrinkage in micropatterned AuNPs@PNIPAM hydrogel films
2026 · Minseung Hyun, Younghun Kim · International Journal of Adhesion and Adhesives
Process intensification and techno-economic analysis of ethylene glycol recovery from PET glycolysis: a comparative evaluation of distillation configurations
2026 · Yungun Jeong, Yeonsoo Kim, et al. · Journal of Industrial and Engineering Chemistry
GDOP and Reliability Aware Anchor Node Selection via Machine Learning for RSSI-Based Localization
2026 · Chao Sun, Youngok Kim · International Conference on Information Networking
Design and Optimization of Doping Concentration of the JFET Region of 4H-SiC VDMOSFETs
2025 · Hye-won Lee, Ye-jin Kim, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
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Improvement of Electrical Properties in 4H-SiC MOSFETs by Nitric Oxide Post-Oxidation Annealing
2025 · Chang-jun Park, Young-hun Cho, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
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Optimization of 1.2 kV 4H-SiC MOSFETs with Vertical Variation Doping Structure
2024 · Ye-jin Kim, Seung-hyun Park, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
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Works count: 12
Citation count: 8
H-index: 2
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