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Jianping Zhang
Institution:
PLA Army Engineering University
Observed institutions:
Chinese People's Liberation Army,
PLA Army Engineering University
ORCID:
0000-0001-7486-5929
Observed ORCID:
0000-0001-7486-5929
OpenAlex ID:
A5057317667
Analysis of failure mechanisms in enhancement-mode GaN HEMTs under negative VF-TLP pulses with picosecond fall times
2026
·
Jianping Zhang
, XiaoFeng Hu
, et al.
·
Journal of Electrostatics
·
2
Research on the Effect of Metal Electrode Coupling Voltage under Induced Electrostatic Discharge
2021
·
Jianping Zhang
, Xiaofeng Hu
, et al.
·
Mathematical Problems in Engineering
·
2
PDF
Breakdown characteristics of GaN HEMTs under picosecond fast-rise VF-TLP stress
2026
·
Jianping Zhang
, XiaoFeng Hu
, et al.
·
Journal of Electrostatics
·
1
Analysis of electrostatic effects in enhancement-mode GaN HEMTs under picosecond fast-rise VF-TLP stress
2026
·
Jianping Zhang
, Xiaofeng Hu
, et al.
·
Journal of Electrostatics
Investigation on Latent Damage Mechanisms in Enhanced-Mode GaN HEMTs under Very-Fast Transmission Line Pulse Stress
2026
·
Jianping Zhang
, Xiaofeng Hu
, et al.
·
Journal of Electronic Materials
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Works count:
5
Citation count:
5
H-index:
2
I10-index:
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