Get started
Author

Ayushi Sharma

ORCID: 0000-0002-8542-347X
Observed ORCID: 0000-0002-8542-347X
OpenAlex ID: A5057317857
Robust Compact Model of High-Voltage MOSFET’s Drift Region
2022 · Girish Pahwa, Ayushi Sharma, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 24
Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors
2024 · Ayushi Sharma, Yawar Hayat Zarkob, et al. · IEEE Transactions on Electron Devices · 8
Recent Enhancements in the Standard BSIM-BULK MOSFET Model
2022 · Ayushi Sharma, Yawar Hayat Zarkob, et al. · IEEE International Conference on Emerging Electronics (ICEE) · 7
Computational Approaches to Optimizing Perovskite Solar Cell Performance
2023 · Ayushi Sharma, Chandani Dubey, et al. · 4
Analysis and Modeling of Current Mismatch in Negative Capacitance Field-Effect Transistor
2022 · Ravi Goel, Ayushi Sharma, et al. · IEEE Transactions on Electron Devices · 4
Analysis and Modeling of OFF-State Capacitance in LDD MOSFETs
2023 · Ayushi Sharma, Ravi Goel, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 3
Compact Modeling and Experimental Validation of Reverse Mode Impact Ionization in LDMOS Transistors within the BSIM-BULK Framework
2024 · Yawar Hayat Zarkob, Ayushi Sharma, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 2
Characterization and Experimental Validation of Self Heating in RF LDMOS Transistor using BSIM-BULK Model
2024 · Ayushi Sharma, Shivendra Singh Parihar, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 2
Recent Enhancements in the Industry Standard BSIM-BULK Compact Model
2025 · Yawar Hayat Zarkob, Dinesh Rajasekharan, et al. · 1
Impact Ionization in LDMOS Transistors: Improved Compact Model and Asymmetry Under Forward and Reverse Modes of Operation
2025 · Yawar Hayat Zarkob, Dinesh Rajasekharan, et al. · IEEE Journal of the Electron Devices Society · 1
An Improved Overlap Capacitance Model for LDMOS Transistors based on the BSIM-BULK Framework
2024 · Ayushi Sharma, Ahtisham Pampori, et al. · International Conference on Simulation of Semiconductor Processes and Devices · 1
Characterization and Modeling of SH in Multi-Finger RF LDMOS Transistors Using BSIM-BULK Model
2025 · Ayushi Sharma, Shivendra Singh Parihar, et al. · IEEE Journal of the Electron Devices Society
Works count: 12
Citation count: 57
H-index: 4
I10-index: 1
Year
Topic
Type