Author

I. Bouanane

Institution: University of Skikda

Observed institution: University of Skikda

OpenAlex ID: A5057980593

Photoluminescence Study of Deep Level Defects in ZnO Thin Films

2018 · A. Kabir, I. Bouanane, et al. · Silicon · 23

Characterization of ZnO Thin Films Prepared by Thermal Oxidation of Zn

2016 · I. Bouanane, A. Kabir, et al. · Journal of Electronic Materials · 14

Oxidation Temperature Dependence of the Structural, Optical and Electrical Properties of SnO2 Thin Films

2016 · D. Boulainine, A. Kabir, et al. · Journal of Electronic Materials · 7

Physical properties of SnO2 thin films prepared by isothermal oxidation of vacuum evaporated Sn

2016 · A. Kabir, D. Boulainine, et al. · Journal of Materials Science Materials in Electronics · 4

Physical Characterization of SnO₂ Films Prepared by the Rheotaxial Growth and Thermal Oxidation (RGTO) Method

2016 · A. Kabir, D. Boulainine, et al. · World Academy of Science, Engineering and Technology, International Journal of Materials and Metallurgical Engineering

Works count: 5

Citation count: 48

H-index: 4

I10-index: 2