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Author

Yan-Hsiu Liu

ORCID: 0009-0006-2312-3902
Observed ORCID: 0009-0006-2312-3902
OpenAlex ID: A5058016703
From IC Layout to Die Photograph: A CNN-Based Data-Driven Approach
2020 · Hao-Chiang Shao, Chao-Yi Peng, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 47
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LithoHoD: A Litho Simulator-Powered Framework for IC Layout Hotspot Detection
2024 · Hao-Chiang Shao, Guan-Yu Chen, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 13
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Keeping Deep Lithography Simulators Updated: Global–Local Shape-Based Novelty Detection and Active Learning
2022 · Hao-Chiang Shao, Hsing-Lei Ping, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 10
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Layout Hotspot Pattern Clustering Using a Density-based Approach
2023 · Ciao-Syun Lin, Pin-Yian Tsai, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 4
Exploring “Many in Few” and “Few in Many” Properties in Long-Tailed, Highly Imbalanced IC Defect Classification
2025 · Hao-Chiang Shao, Chun-Hao Chang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2
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Improving CNN-based Pad Defect Classification with Enhanced Preprocessing Techniques
2025 · Chia-Feng Chien, Ming-Wei Chen, et al. · International SoC Design Conference · 1
Integrating Automatic Prompt Engineering and Vision-Language Model for Pad Defect Classification
2026 · Yi-Ting Shen, Yan-Hsiu Liu, et al. · International Symposium on Quality Electronic Design (ISQED)
A Flexible Cluster Tool Simulation Framework with Wafer Batch Dispatching Time Recommendation
2023 · Hsin-Ping Yen, Shiuan-Hau Huang, et al. · International Symposium on Quality Electronic Design (ISQED)
Cluster Tool Performance Analysis using Graph Database
2021 · Shiuan-Hau Huang, Hsin-Ping Yen, et al. · IEEE International System-on-Chip Conference (SOCC)
Works count: 9
Citation count: 77
H-index: 4
I10-index: 3
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