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Charles Schlechte
Observed names:
C. Schlechte,
Schlechte, Charles
Institution:
Tokyo Electron (Japan)
Observed institution:
Tokyo Electron (Japan)
ORCID:
0000-0002-3317-1776
Observed ORCID:
0000-0002-3317-1776
OpenAlex ID:
A5058462399
Characterization of neutral species in an NH3-Ar plasma generated by a capacitively coupled plasma source at various radio frequencies
2023
·
S. M. Johnson
, J. P. Zhao
, et al.
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
3
Plasma enhanced atomic layer deposition of silicon nitride and silicon carbonitride using a single source precursor and different plasmas
2025
·
Samuel M. Johnson
, Jianping Zhao
, et al.
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
1
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Works count:
4
Citation count:
4
H-index:
1
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