Author

Gabriel Droulers

Observed names: Droulers Gabriel, Droulers, G, Droulers, G., Droulers, Gabriel, G Droulers, G. Droulers, G., Droulers
Institution: Dalsa Corporation
ORCID: 0000-0002-8743-5271
Observed ORCID: 0000-0002-8743-5271
OpenAlex ID: A5058836524
2022 · A. M. J. Zwerver, T. Krähenmann, et al. · Nature Electronics · 417
2020 · W. I. L. Lawrie, H. G. J. Eenink, et al. · Applied Physics Letters · 148
2018 · L. Petit, J. M. Boter, et al. · Physical Review Letters · 125
2019 · D. Sabbagh, N. Thomas, et al. · Physical Review Applied · 56
2018 · R. Pillarisetty, N. Thomas, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 39
2011 · G. Droulers, A. Beaumont, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 30
2010 · S. Finkelman, M. Sachs, et al. · Physical Review B · 14
2016 · J. S. Clarke, N. Thomas, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 8
2022 · A. M. J. Zwerver, T. Krähenmann, et al. · Nature Electronics · 7
2017 · Dominique Drouin, Gabriel Droulers, et al. · Journal of Nanomaterials · 7
2014 · Gabriel Droulers, Serge Ecoffey, et al. · IEEE International Conference on Nanotechnology (IEEE-NANO) · 5
2025 · Redouane Amrar, Ali Soltani, et al. · Optical Materials Express · 4
2017 · Gabriel Droulers, Serge Ecoffey, et al. · IEEE Transactions on Electron Devices · 4
2016 · Gabriel Droulers, Serge Ecoffey, et al. · European Solid-State Device Research Conference · 3
2016 · Gabriel Droulers, Serge Ecoffey, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2
2023 · Mostafa Keshavarzi, Rajesh Pandiyan, et al. · International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS) · 1
2015 · D. Drouin, G. Droulers, et al. · IEEE International Conference on Nanotechnology (IEEE-NANO) · 1
2015 · D Drouin, M A-Bounouar, et al. · IEEE VLSI Test Symposium (VTS) · 1
2018 · Diego Sabbagh, N. Thomas, et al. · arXiv (Cornell University)
2018 · Luca Petit, Jelmer M. Boter, et al. · Bulletin of the American Physical Society
2018 · Hubert C. George, Kanwal Jit Singh, et al. · Bulletin of the American Physical Society
2017 · Giordano Scappucci, L. A. Yeoh, et al. · Bulletin of the American Physical Society
Works count: 32
Citation count: 875
H-index: 8
I10-index: 7
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