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Hidenobu Mori

Observed names: H Mori, H. Mori
Institution: University of Hyogo
ORCID: 0000-0002-9115-3357
Observed ORCID: 0000-0002-9115-3357
OpenAlex ID: A5059281160
Development of a new data collection system and chamber for microbeam and laser investigations of single event phenomena
2001 · J.S Laird, T Hirao, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 65
Temperature dependence of heavy ion-induced current transients in Si epilayer devices
2002 · J.S. Laird, T. Hirao, et al. · IEEE Transactions on Nuclear Science · 49
Spectral response of a gamma and electron irradiated pin photodiode
2002 · S. Onoda, T. Hirao, et al. · IEEE Transactions on Nuclear Science · 27
Displacement damage degradation of ion-induced charge in Si pin photodiode
2003 · Shinobu Onoda, Toshio Hirao, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 19
Studies on single-event phenomena using the heavy-ion microbeam at JAERI
2003 · Toshio Hirao, Hidenobu Mori, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 11
TCAD modeling of single MeV ion induced charge collection processes in Si devices
2003 · Jamie Stuart Laird, Toshio Hirao, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 9
A System for Ultra-Fast Transient Ion and Pulsed Laser Current Microscopies as a Function of Temperature
2001 · Jamie Steward Laird, Toshio Hirao, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 8
A comparison of heavy ion and picosecond laser microbeams for investigating single event transients in InGaAs on InP photodetectors
2003 · Jamie Stuart Laird, Toshio Hirao, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 7
Investigation of radiation degradation of Si and GaAlAs optical devices due to gamma-ray and electron irradiation
2001 · Shinobu Onoda, Hidenobu Mori, et al. · Radiation Physics and Chemistry · 6
Investigation of single-event charge collection from angled ion strikes
2001 · Hidenobu Mori, Toshio Hirao, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 5
Temperature dependence of heavy ion induced current transients in Si epilayer devices
2005 · J.S. Laird, T. Hirao, et al. · European Conference on Radiation and Its Effects on Components and Systems · 4
Study of single-event current pulses induced in SOI diodes by collimated swift heavy-ions micro-beams
2003 · Toshio Hirao, Hidenobu Mori, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 3
Effect of hot isostatic pressing treatment on the thermoelectric power factors of zinc oxides
2024 · Hidenobu Mori, Haruhiko Yoshida · Scientific Reports · 2
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Estimation of fast transient current degradation analyzed by non-ionizing energy loss
2003 · Shinobu Onoda, Toshio Hirao, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2
Comparison of the ion induced charge collection in Si epilayer and SOI devices
2003 · Toshio Hirao, Hidenobu Mori, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2
Effect of Post Deposition Annealing on Electrical Properties of GaOx/Si structure by Mist Chemical Vapor Deposition Method
2022 · Hidenobu Mori, Haruhiko Yoshida · IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) · 1
Recent studies of single-event phenomena in devices using the heavy-ion microbeam at JAERI
2005 · T. Hirao, J.S. Laird, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
The Investigation of Charge Transport Properties of SOI Semiconductor Devices Using a Heavy Ion Microbeam
2001 · Toshio Hirao, Jamie Steward Laird, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1
Profiling of collimated swift ion microbeam using 16Mbit DRAM
2001 · Hidenobu Mori, Toshio Hirao, et al. · Radiation Physics and Chemistry · 1
Doping Effects of SnO 2 Nanoparticles Used as Carbon-Free ORR Catalysts for Proton-Exchange-Membrane Fuel Cells
2026 · Takeshi Fukuda, Ryuki Tsuji, et al. · The Journal of Physical Chemistry C
Effect of Hip Treatment on Thermoelectric Properties of Tio2-X
2024 · Hidenobu Mori, Haruhiko Yoshida · SSRN Electronic Journal
Temperature Dependence of Oxygen Annealing Effect on Electrical Properties of GaOx/Si Structure by Mist Chemical Vapor Deposition
2023 · Hidenobu Mori, Haruhiko Yoshida · IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)
Thermoelectric Properties in Nonstoichimetric Manganese Calcium Oxide
2021 · Misato Akaeda, Hidenobu Mori, et al. · The Japan Society of Applied Physics
Effect of post deposition annealing on GaO x film deposited by mist CVD Method (II)
2019 · Hiroaki Matsuda, Hidenobu Mori, et al. · The Japan Society of Applied Physics
Microscopic Imaging of Inversion Layer Formation in Insulator/Semiconductor Structure by Scanning Capacitance Transient Microscopy
2018 · Hidenobu Mori, Haruhiko Yoshida · IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)
Works count: 34
Citation count: 223
H-index: 7
I10-index: 5
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