Author

Yan Ren

Observed names: Ren, Y. (author), Y. Ren, Yan REN

Observed institutions: Xi'an Jiaotong University, Delft University of Technology

ORCID: 0000-0002-9830-5296

Observed ORCID: 0000-0002-9830-5296

OpenAlex ID: A5059328383

Transmission electron imaging in the Delft multibeam scanning electron microscope 1

2016 · Yan Ren, Pieter Kruit · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 22

Differential algebraic method for computing the high order aberrations of practical electron lenses

2006 · Yongfeng Kang, Tiantong Tang, et al. · Optik · 21

A large current scanning electron microscope with MEMS-based multi-beam optics

2013 · Takashi Ichimura, Yan Ren, et al. · Microelectronic Engineering · 16

A high-current scanning electron microscope with multi-beam optics

2016 · Takashi Doi, Minoru Yamazaki, et al. · Microelectronic Engineering · 6

Imaging systems in the Delft Multi-Beam Scanning Electron Microscope 1

2017 · Y. Ren · Research Repository (Delft University of Technology) · 4

Multi-Beam Scanning Electron Microscope Design

2016 · Pieter Kruit, Yan Ren · Microscopy and Microanalysis · 3

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The aberration theory of a combined electron focusing–deflection system with a rotating deflection field following the rotation of the electrons

2006 · Yan Ren, Tiantong Tang, et al. · Optik · 2

Study on current density distribution of electron beam spots by wave optics theory

2007 · Xiaoli Guo, Tiantong Tang, et al. · Optik · 1

Multi-Beam Scanning Electron Microscopy (MBSEM) at 0.5 TB/s ?

2015 · Shammi Rahangdale, Yan Ren, et al. · Image Analysis & Stereology

Study of routing strategy on complex networks

2010 · Hai-juan ZANG, Yan REN, et al. · Journal of Computer Applications

Works count: 12

Citation count: 77

H-index: 4

I10-index: 3