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Xavier Dubois
Observed names:
Dubois, Xavier,
X. Dubois
OpenAlex ID:
A5060477297
The reproducibility of a new power mapping instrument based on the phase shifting schlieren method for the measurement of spherical and toric contact lenses
2009
·
Luc Joannes
, Tony Hough
, et al.
·
Contact Lens and Anterior Eye
·
42
Compressive Imaging and Characterization of Sparse Light Deflection Maps
2015
·
Prasad Sudhakar
, Laurent Jacques
, et al.
·
SIAM Journal on Imaging Sciences
·
10
Compressive schlieren deflectometry
2013
·
P. Sudhakar
, L. Jacques
, et al.
·
IEEE International Conference on Acoustics Speech and Signal Processing
·
4
Phase object power mapping and cosmetic defects enhancement by Fourier-based deflectometry
2009
·
D. Beghuin
, X. Dubois
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Reproducibility of contact lens power measurements using the phase shifting schlieren method
2009
·
Luc Joannes
, Tony Hough
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
The HEMERA Balloon Research Infrastructure
2021
·
Felix Friedl-Vallon
, Philippe Raizonville
, et al.
·
1
Compressive Acquisition of Sparse Deflectometric Maps
2013
·
Prasad Sudhakara Murthy
, Laurent Jacques
, et al.
·
1
Hemera: The European Community for Advanced Research in the Stratosphere
2023
·
Marta Albano
, D. Spoto
, et al.
·
Aerotecnica Missili & Spazio
Hyperspectral imager for components identification in the atmosphere
2017
·
Jean-Luc Dewandel
, Didier Beghuin
, et al.
·
International Conference on Space Optics (ICSO)
PDF
Compressive Imaging and Characterization of Sparse Light Deflection Maps
2014
·
Sudhakar, Prasad
, Jacques, Laurent
, et al.
·
arXiv (Cornell University)
PDF
Compressive Schlieren Deflectometry
2012
·
Sudhakar, Prasad
, Jacques, Laurent
, et al.
·
arXiv (Cornell University)
PDF
Interferometric precision with Fourier-based deflectometry
2010
·
D. Beghuin
, X. Dubois
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Interferometric Sensitivity with Fourier Based Deflectometry
2010
·
D. Beghuin
, X. Dubois
, et al.
·
AIP conference proceedings
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Works count:
15
Citation count:
62
H-index:
3
I10-index:
2
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