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Penglong Xu

Observed name: P.J. Xu
ORCID: 0009-0004-1435-4608
Observed ORCID: 0009-0004-1435-4608
OpenAlex ID: A5060583370
Improved Hot-Carrier Reliability of an Ultralow R ON,sp SOI-LDMOS by Linearly Doped Technology for Automotive Application
2023 · Li Lu, Jiaojing Bian, et al. · IEEE Transactions on Electron Devices · 15
Influences of Adjacent High Voltage on the Characteristics and Reliability of SOI Power Devices for Automotive Application
2024 · Ran Ye, Jiaojing Bian, et al. · IEEE Transactions on Electron Devices · 7
Mechanism Analysis and Improved Model for HCI in 200V STI-based Triple RESURF LDMOS With n-p-n Layer
2023 · Zuquan Zheng, Ming Qiao, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 7
An Ultralow Specific On-Resistance 200V LDMOS for Voltage Extension of a 0.18µm BCD Process
2022 · Ming Qiao, Wenliang Liu, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 7
Hot Carrier Suppression for Low Ron Degradation in a Triple RESURF LDMOS
2025 · Wenliang Liu, Penglong Xu, et al. · IEEE Transactions on Electron Devices · 5
Layout Concern on Power Devices Based on 0.18μm 200V SOI-BCD Technology for Stable Electrical Characteristics and Reliability
2024 · Ran Ye, Jiaojing Bian, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 4
Iteration-Based Temporal Subgridding Method for the Finite-Difference Time-Domain Algorithm
2024 · Penglong Xu, Jinjie Liu · Mathematics · 4
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Wide-band digital down conversion technique based on poly-phase filter
2015 · N. Pang, H.Q. Mu, et al. · IET International Radar Conference · 3
A new acceleration estimation method based on special frft in mimo radar
2015 · N. Pang, P.J. Xu · IET International Radar Conference · 3
A complete ensemble empirical mode decomposition for GPR signal time-frequency analysis
2014 · Jing Li, Lingna Chen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
A Quadruple RESURF LDMOS with Enhanced Hot-Carrier-Induced Degradation Immunity
2025 · Wenliang Liu, Ming Qiao, et al. · IEEE International Conference on ASIC (ASICON) · 2
Investigation on Distinct Two-Stage R ON Degradation Mechanisms in STI- and LOCOS-Based Triple RESURF LDMOS Devices
2025 · Wenliang Liu, Penglong Xu, et al. · IEEE Transactions on Electron Devices · 2
Simulation and signal processing of through wall UWB radar for human being's periodic motions detection
2013 · Jing Li, Fengshan Liu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Investigation of Dual-Mode R on Degradation Mechanisms in LOCOS-Based LDMOS
2025 · Wenliang Liu, Ming Qiao, et al. · IEEE International Conference on ASIC (ASICON)
Breast image registration by using non-linear local affine transformation
2013 · Feiyu Chen, Peng Zheng, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 15
Citation count: 63
H-index: 5
I10-index: 1
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