Author

Martin Reufer

2005 · Martin Reufer, Manfred J. Walter, et al. · Nature Materials · 212
2004 · M. Reufer, S. Riechel, et al. · Applied Physics Letters · 84
2004 · Dmitry S. Koktysh, Nikolai Gaponik, et al. · ChemPhysChem · 75
2008 · R. Bohdan, A. Bercha, et al. · Journal of Applied Physics · 34
2007 · M. Bou Sanayeh, P. Brick, et al. · Applied Physics Letters · 33
2006 · M. Reufer, P. G. Lagoudakis, et al. · Physical Review B · 24
2004 · J. Stehr, J. M. Lupton, et al. · Advanced Materials · 21
2014 · C. Prall, M. Ruebesam, et al. · Journal of Crystal Growth · 20
2003 · M. Reufer, F. Schindler, et al. · Chemical Physics Letters · 19
2008 · Mathias Ziegler, Robert Pomraenke, et al. · Applied Physics Letters · 13
2008 · M. Bou Sanayeh, P. Brick, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2006 · M. Reufer, J. M. Lupton, et al. · Applied Physics Letters · 13
2007 · Marwan Bou Sanayeh, Peter Brick, et al. · Journal of Materials Science Materials in Electronics · 10
2007 · M. Müller, M. Philippens, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
2009 · A. Bercha, R. Bohdan, et al. · physica status solidi (b) · 8
2008 · Jens W. Tomm, Mathias Ziegler, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2008 · Harald König, Günther Grönninger, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2008 · Bernd Köhler, Sandra Ahlert, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2010 · N. Collings, M. Reufer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2009 · Bernard Piechal, Jens W. Tomm, et al. · Applied Physics A · 5
2008 · J.M.G. Tijero, H. Odriozola, et al. · International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) · 3
2010 · J. M. G. Tijero, H. Odriozola, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2017 · Inga-Maria Eichentopf, Martin Reufer · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
2016 · Inga-Maria Eichentopf, Martin Reufer · tm - Technisches Messen · 1
Works count: 28
Citation count: 665
H-index: 13
I10-index: 15
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