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Author

Maurice Meijer

Observed names: M. Meijer, Meijer, Maurice, Meijer, RIMP Maurice, Rimp Maurice Meijer
Institution: NXP (Netherlands)
Observed institutions: NXP (Netherlands), Philips (Netherlands), NXP (Germany), NXP (Belgium), Signify (Netherlands), Eindhoven University of Technology
OpenAlex ID: A5061465128
BitWave: Exploiting Column-Based Bit-Level Sparsity for Deep Learning Acceleration
2024 · Man Shi, Vikram Jain, et al. · IEEE International Symposium on High-Performance Computer Architecture (HPCA) · 54
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Characterization of STI Edge Effects on CMOS Variability
2009 · Nicole Wils, Hans P. Tuinhout, et al. · IEEE Transactions on Semiconductor Manufacturing · 36
A forward body bias generator for digital CMOS circuits with supply voltage scaling
2010 · Maurice Meijer, Jose Pineda de Gyvez, et al. · IEEE International Symposium on Circuits and Systems proceedings · 29
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Testing and Diagnosis of Power Switches in SOCs
2006 · S.K. Goel, M. Meijer, et al. · IEEE European Test Symposium (ETS) · 29
On-chip digital power supply control for system-on-chip applications
2005 · Maurice Meijer, José Pineda de Gyvez, et al. · International Symposium on Low Power Electronics and Design (ISLPED) · 29
Body-Bias-Driven Design Strategy for Area- and Performance-Efficient CMOS Circuits
2010 · Maurice Meijer, José Pineda de Gyvez · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 28
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Technology exploration for adaptive power and frequency scaling in 90nm CMOS
2004 · Maurice Meijer, Francesco Pessolano, et al. · International Symposium on Low Power Electronics and Design (ISLPED) · 22
Digital Systems Power Management for High Performance Mixed Signal Platforms
2014 · Ajay Kapoor, Cas Groot, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 18
Technological Boundaries of Voltage and Frequency Scaling for Power Performance Tuning
2008 · Maurice Meijer, José Pineda Gyvez · Integrated circuits and systems · 18
Technology scaling of critical charges in storage circuits based on cross-coupled inverter-pairs
2004 · T. Heijmen, B. Kruseman, et al. · IEEE International Reliability Physics Symposium proceedings · 18
A 350nA voltage regulator for 90nm CMOS digital circuits with Reverse-Body-Bias
2011 · Gerard Villar Pique, Maurice Meijer · European Solid-State Circuits Conference (ESSCIRC) · 14
Ultra-Low-Power Digital Design with Body Biasing for Low Area and Performance-Efficient Operation
2010 · Maurice Meijer, José Pineda De Gyvez, et al. · Journal of Low Power Electronics · 14
Post-silicon tuning capabilities of 45nm low-power CMOS digital circuits
2009 · Maurice Meijer, Bo Liu, et al. · TU/e Research Portal · 13
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Limits to Performance Spread Tuning using Adaptive Voltage and Body Biasing
2005 · M. Meijer, F. Pessolano, et al. · IEEE International Symposium on Circuits and Systems proceedings · 13
Energy-Efficient FPGA Interconnect Design
2006 · M. Meijer, R. Krishnan, et al. · Design, Automation, and Test in Europe · 10
Efficient testing and diagnosis of faulty power switches in SOCs
2007 · S.K. Goel, M. Meijer, et al. · IET Computers & Digital Techniques · 9
Body bias driven design synthesis for optimum performance per area
2010 · Maurice Meijer, Jose Pineda de Gyvez · International Symposium on Quality Electronic Design (ISQED) · 8
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Influence of STI stress on drain current matching in advanced CMOS
2008 · Nicole Wils, Hans Tuinhout, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 8
CMDS: Cross-layer Dataflow Optimization for DNN Accelerators Exploiting Multi-bank Memories
2023 · Man Shi, Steven Colleman, et al. · International Symposium on Quality Electronic Design (ISQED) · 7
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Power Challenges Caused by IOT Edge Nodes: Securing and Sensing Our World
2019 · James Spehar, Adam Fuks, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 7
Methodology to evaluate long channel matching deterioration and effects of transistor segmentation on MOSFET matching
2010 · Hans Tuinhout, Nicole Wils, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 6
A High-Frequency Nonquasi-Static Analytical Model Including Gate Leakage Effects for On-Chip Decoupling Capacitors
2006 · J. Rius, M. Meijer · IEEE Transactions on Advanced Packaging · 6
Analysis of the Influence of Substrate on the Performance of On-Chip MOS Decoupling Capacitors
2009 · Josep Rius, Maurice Meijer · IEEE Journal of Solid-State Circuits · 5
Aggressor aware repeater circuits for improving on-chip bus performance and robustness
2004 · A. Katoch, S.K. Jain, et al. · European Solid-State Circuits Conference (ESSCIRC) · 5
Reducing Cross-Talk Induced Power Consumption and Delay
2004 · André K. Nieuwland, Atul Katoch, et al. · Lecture notes in computer science · 5
Works count: 60
Citation count: 451
H-index: 13
I10-index: 15
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