Author

Arif Shahriar

2003 · Chang Seok Kang, H.-J. Cho, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 94
2003 · Rino Choi, K. Onishi, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 28
2003 · Chang Seok Kang, H.-J. Cho, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 19
2003 · Y.H. Kim, K. Onishi, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 18
2003 · Y. H. Kim, K. Onishi, et al. · IEEE International Reliability Physics Symposium proceedings · 12
2014 · Ayed Al Sayem, Arif Shahriar, et al. · International Conference on Electrical and Computer Engineering (ICECE) · 11
2010 · M. S. Islam, Md. Rakibul Karim Akanda, et al. · International Conference on Electrical and Computer Engineering (ICECE) · 11
2003 · Y.H. Kim, K. Onishi, et al. · IEEE International Reliability Physics Symposium proceedings · 6
2013 · Shahriar, Arif, Mahdy, M. R. C., et al. · arXiv (Cornell University) · 4
2014 · Md. Jubayer Shawon, Arif Shahriar, et al. · International Conference on Electrical and Computer Engineering (ICECE) · 2
2025 · Md. Waheduzzaman Basunia Nouman, Arif Shahriar, et al. · BAUST Journal
Works count: 12
Citation count: 214
H-index: 8
I10-index: 7
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