Author

K. F. Badawi

Observed names: K F Badawi, K-F Badawi, K-F. Badawi, K. Badawi, K. E. Badawi, K. F. BADAWI, K.-F. Badawi, K.F Badawi, K.F. Badawi

Observed institutions: Centre National de la Recherche Scientifique, Dassault Aviation (France), Université de Bourgogne, Université de Poitiers, Instituts Universitaires de Technologie, Institut National Polytechnique de Lorraine

OpenAlex ID: A5061791244

Atomistic calculation of size effects on elastic coefficients in nanometre-sized tungsten layers and wires

2004 · P Villain, P Beauchamp, et al. · Scripta Materialia · 82

Size effect on intragranular elastic constants in thin tungsten films

2002 · P. Villain, Ph. Goudeau, et al. · Applied Physics Letters · 76

Measuring thin film and multilayer elastic constants by coupling in situ tensile testing with x-ray diffraction

2002 · K. F. Badawi, P. Villain, et al. · Applied Physics Letters · 76

Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses

1995 · D. Rats, L. Bimbault, et al. · Journal of Applied Physics · 73

Poisson’s ratio measurement in tungsten thin films combining an x-ray diffractometer with in situ tensile tester

1998 · P.-O. Renault, K. F. Badawi, et al. · Applied Physics Letters · 71

Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data

2003 · P.-O. Renault, E. Le Bourhis, et al. · Applied Physics Letters · 58

Microstructure of Pt-modified aluminide coatings on Ni-based superalloys

2003 · J. Benoist, K.F. Badawi, et al. · Surface and Coatings Technology · 57

Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

2003 · P.O. Renault, P. Villain, et al. · Thin Solid Films · 44

Microstructure of Pt modified aluminide coatings on Ni-based superalloys without prior Pt diffusion

2004 · J. Benoist, K.F. Badawi, et al. · Surface and Coatings Technology · 43

Study of the mechanical and microstructural state of platinum thin films

1996 · V. Branger, V. Pelosin, et al. · Thin Solid Films · 43

Characterization of thin film elastic properties using X-ray diffraction and mechanical methods: application to polycrystalline stainless steel

2001 · P Goudeau, P.O Renault, et al. · Thin Solid Films · 39

Residual stresses and microstructure in tungsten thin films analyzed by x-ray diffraction-evolution under ion irradiation

1996 · N. Durand, K. F. Badawi, et al. · Journal of Applied Physics · 36

Determination of the residual stress tensor in Cu/W multilayers by x-ray diffraction

1993 · Ph. Goudeau, K. F. Badawi, et al. · Applied Physics Letters · 35

Observation par topographie aux rayons X des configurations de dislocations développées a l'extrémité d'une fissure dans le silicium

1980 · Par G. Michot, K. Badawi, et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 34

X-ray diffraction study of residual stresses and microstructure in tungsten thin films sputter deposited on polyimide

2003 · P. Villain, P. Goudeau, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 33

Elastic constants investigation by X-ray diffraction of in situ deformed metallic multi-layers

2003 · P. Goudeau, P. Villain, et al. · Scripta Materialia · 25

X-ray diffraction study of residual stress modification in Cu/W superlattices irradiated by light and heavy ions

1993 · K.F. Badawi, Ph. Goudeau, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 25

X-Ray diffraction measurement of the Poisson's ratio in Mo sublayers of Ni/Mo multilayers

2002 · P. Villain, P.-O. Renault, et al. · Thin Solid Films · 22

Relaxation of residual stresses in highly stressed multilayers initiated by ion irradiation

1995 · L. Pranevicˇius, K-F. Badawi, et al. · Surface and Coatings Technology · 21

Profile analysis of thin film X-ray diffraction peaks

1996 · L. Bimbault, K.F. Badawi, et al. · Thin Solid Films · 17

Study by complementary X-ray techniques of in-depth microstructure in Ni-based superalloys after Pt diffusion treatment

2002 · J Benoist, T Girardeau, et al. · Surface and Coatings Technology · 15

Détermination des contraintes résiduelles par diffraction des rayons X dans une couche mince de 1 000 Å de tungstène

1992 · K. F. Badawi, A. Declémy, et al. · Journal de Physique III · 15

Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction

1996 · N. Durand, K.F. Badawi, et al. · Thin Solid Films · 14

Residual stresses and microstructure of Ag-Ni multilayers

1994 · K.-F. Badawi, N. Durand, et al. · Applied Physics Letters · 12

Mesure par diffraction des rayons X des microdéformations dans des films minces texturés d'Au

1994 · N. Durand, L. Bimbault, et al. · Journal de Physique III · 12

Works count: 71

Citation count: 1,145

H-index: 19

I10-index: 31