Author

K. R. C. Mok

Observed names: K. R. M. Mok, K.R. Mok, K.R.C. Mok, Mok, K.R.C., Mok, KRC, Mok, KRC

Observed institutions: Universidad de Valladolid, National University of Singapore, Nanyang Technological University, University of Surrey, GlobalFoundries (Singapore), Delft University of Technology

OpenAlex ID: A5061830128

Robust UV/VUV/EUV PureB Photodiode Detector Technology With High CMOS Compatibility

2014 · Lis K. Nanver, Lin Qi, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 74

UV-Sensitive Low Dark-Count PureB Single-Photon Avalanche Diode

2014 · Lin Qi, K. R. C. Mok, et al. · IEEE Transactions on Electron Devices · 38

Ion-beam amorphization of semiconductors: A physical model based on the amorphous pocket population

2005 · K. R. C. Mok, M. Jaraiz, et al. · Journal of Applied Physics · 28

Temperature dependency of the kinetics of PureB CVD deposition over patterned Si/SiO2 surfaces

2014 · V. Mohammadi, N. Golshani, et al. · Microelectronic Engineering · 23

Comprehensive model of damage accumulation in silicon

2008 · K. R. C. Mok, F. Benistant, et al. · Journal of Applied Physics · 23

(Invited) Pure Dopant Deposition of B and Ga for Ultrashallow Junctions in Si-based Devices

2012 · L. K. Nanver, A. Sammak, et al. · ECS Transactions · 21

PDF

The impact of nitrogen co-implantation on boron ultra-shallow junction formation and underlying physical understanding

2008 · S.H. Yeong, B. Colombeau, et al. · Materials Science and Engineering B · 15

PureB single-photon avalanche diodes for low-energy electron detection down to 200 eV

2015 · Lin Qi, S. Sluyterman, et al. · Optics Letters · 12

UV-sensitive low dark-count PureB single-photon avalanche diode

2013 · Lin Qi, K. R. C. Mok, et al. · Proceedings of IEEE Sensors/Proceedings of IEEE Sensors ... · 12

Boron-Doped Silicon Surfaces From B$_{\bf 2}$H $_{\bf 6}$ Passivated by ALD Al$_{\bf 2}$O$_{\bf 3}$ for Solar Cells

2015 · K. R. C. Mok, Bas W. H. van de Loo, et al. · IEEE Journal of Photovoltaics · 10

Effects of Annealing on Chemical-Vapor Deposited PureB Layers

2013 · K. R. C. Mok, A. H. G. Vlooswijk, et al. · ECS Journal of Solid State Science and Technology · 9

PDF

Ultra-Shallow Junction Formation—Physics and Advanced Technology

2008 · B. Colombeau, S. H. Yeong, et al. · AIP conference proceedings · 9

Predictive Simulation of Advanced Nano-CMOS Devices Based on kMC Process Simulation

2007 · K.R.C. Mok, B.. Colombeau, et al. · IEEE Transactions on Electron Devices · 9

Physically based modeling of dislocation loops in ion implantation processing in silicon

2005 · P. Castrillo, I. Martin-Bragado, et al. · Materials Science and Engineering B · 8

Self-aligned two-layer metallization with low series resistance for litho-less contacting of large-area photodiodes

2015 · K.R.C. Mok, L. Qi, et al. · Solid-State Electronics · 7

Understanding of Carbon/Fluorine Co-implant Effect on Boron-Doped Junction Formed during Soak Annealing

2007 · S. H. Yeong, B. Colombeau, et al. · Journal of The Electrochemical Society · 7

PDF

TCAD simulation of the co-implantation species C, F, and N in MOS transistors

2012 · E. M. Bazizi, K. R. C. Mok, et al. · AIP conference proceedings · 6

Applications of PureB and PureGaB ultrashallow junction technologies

2012 · L. K. Nanver, A. Sammak, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 5

Insights to emitter saturation current densities of boron implanted samples based on defects simulations

2012 · K. R. C. Mok, R. C. G. Naber, et al. · AIP conference proceedings · 5

PDF

Understanding of Boron Junction Stability in Preamorphized Silicon after Optimized Flash Annealing

2008 · S. H. Yeong, B. Colombeau, et al. · Journal of The Electrochemical Society · 5

PDF

Predictive Simulations and Optimization of Advanced Ultra-Shallow Junction formation for Nano-CMOS devices

2007 · B. Colombeau, K.R.C. Mok, et al. · International Workshop on Junction Technology · 5

Comprehensive modeling of ion-implant amorphization in silicon

2005 · K.R.C. Mok, M. Jaraiz, et al. · Materials Science and Engineering B · 5

Fabrication of low dark-count PureB single-photon avalanche diodes

2014 · Lin Qi, K. R. C. Mok, et al. · Symposium on Microelectronics Technology and Devices · 4

Furnace Deposition of PureB Layers from B2H6 for Solar Cell Applications

2014 · Mok, K.R.C., Vlooswijk, A.H.G., et al. · EU PVSEC · 3

TCAD modeling and simulation of boron deactivation in NMOS carbon-implanted channel

2009 · K.R.C. Mok, F. Benistant, et al. · Solid-State Electronics · 3

Works count: 43

Citation count: 358

H-index: 10

I10-index: 10