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Author

Ilho Myeong

Observed name: 명일호
Institution: Myongji University
ORCID: 0000-0002-3662-0231
Observed ORCIDs: 0000-0002-3662-0231, 0009-0003-7343-7289
OpenAlex ID: A5061855785
Comprehensive Design Guidelines of Gate Stack for QLC and Highly Reliable Ferroelectric VNAND
2023 · Suhwan Lim, Taeyoung Kim, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 71
Self-Heating and Electrothermal Properties of Advanced Sub-5-nm Node Nanoplate FET
2020 · Ilho Myeong, Ickhyun Song, et al. · IEEE Electron Device Letters · 56
Analysis of Self Heating Effect in DC/AC Mode in Multi-Channel GAA-Field Effect Transistor
2019 · Ilho Myeong, Dokyun Son, et al. · IEEE Transactions on Electron Devices · 46
Analysis on Self-Heating Effects in Three-Stacked Nanoplate FET
2018 · Hyunsuk Kim, Dokyun Son, et al. · IEEE Transactions on Electron Devices · 37
Strategies for a Wide Memory Window of Ferroelectric FET for Multilevel Ferroelectric VNAND Operation
2024 · Ilho Myeong, Hyoseok Kim, et al. · IEEE Electron Device Letters · 35
Incorporating Bottom-Up Approach Into Device/Circuit Co-Design for SRAM-Based Cache Memory Applications
2022 · Shubham Tayal, Billel Smaani, et al. · IEEE Transactions on Electron Devices · 35
In-depth Analysis of the Hafnia Ferroelectrics as a Key Enabler for Low Voltage & QLC 3D VNAND Beyond 1K Layers: Experimental Demonstration and Modeling
2024 · Giuk Kim, Hyojun Choi, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 32
Investigation of Gate Sidewall Spacer Optimization From OFF-State Leakage Current Perspective in 3-nm Node Device
2019 · Donghyun Ryu, Ilho Myeong, et al. · IEEE Transactions on Electron Devices · 23
Analysis of Electrothermal Characteristics of GAA Vertical Nanoplate-Shaped FETs
2018 · Dokyun Son, Ilho Myeong, et al. · IEEE Transactions on Electron Devices · 23
Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizing ${I}_{OFF}$ in Various Sub-10-nm 3-D Transistors
2018 · Ilho Myeong, Dokyun Son, et al. · IEEE Transactions on Electron Devices · 20
Geometrical influence on Self Heating in Nanowire and Nanosheet FETs using TCAD Simulations
2020 · Min Jae Kang, Ilho Myeong, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 19
Analysis of DC Self Heating Effect in Stacked Nanosheet Gate-All-Around Transistor
2018 · Min Jae Kang, Ilho Myeong, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 16
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND
2024 · Ilho Myeong, Suhwan Lim, et al. · IEEE International Reliability Physics Symposium proceedings · 14
A Simple and Accurate Modeling Method of Channel Thermal Noise Using BSIM4 Noise Models
2020 · Ilho Myeong, Juhyun Kim, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 14
Strain Engineering for 3.5-nm Node in Stacked-Nanoplate FET
2019 · Hyunsuk Kim, Dokyun Son, et al. · IEEE Transactions on Electron Devices · 14
Optimization of Stacked Nanoplate FET for 3-nm Node
2020 · Hyunsuk Kim, Dokyun Son, et al. · IEEE Transactions on Electron Devices · 13
Analysis of Self Heating Effect in Vertical-channel Field Effect Transistor
2019 · Ilho Myeong, Jongwook Jeon, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 6
Analysis on Self Heating Effect for a Trenched Source/Drain Structure in Triple-Stacked Nanowire FET
2018 · Hyunsuk Kim, Do-Kyun Son, et al. · Journal of Nanoscience and Nanotechnology · 6
Analysis of Self-Heating Effects on vertical FET according to Shallow Trench Isolation
2017 · Ilho Myeong, Dokyun Son, et al. · Solid-State Electronics · 6
Review of Ionic-Motion-based Chemimemristive Gas Sensors using Metal-Oxide Semiconductors
2025 · Ilho Myeong, Young Geun Song · Journal of Sensor Science and Technology · 3
A Comprehensive Study of Transient Characteristics in FeFET Using In-Situ Vt Measurement Method
2024 · Ilho Myeong, Hyoseok Kim, et al. · IEEE Electron Device Letters · 3
Study on self-heating effect and lifetime in vertical-channel field effect transistor
2021 · Ilho Myeong, Hyungcheol Shin · Microelectronics Reliability · 3
BSIM-CMG Modeling for 3D NAND Cell with Macaroni Channel
2019 · Minsoo Kim, Ilho Myeong, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 3
Analysis of Self Heating Effect(SHE) according to Buried Oxide Thickness in SOI Nanowire FET
2017 · Ilho Myeong, Dokyun Son, et al. · JSTS Journal of Semiconductor Technology and Science · 3
The Impact of Through Silicon Metal (TSM) Contact on Performance and Thermal Reliability in CFET
2025 · Yunho Shin, Been Kwak, et al. · IEEE Electron Device Letters · 2
Works count: 51
Citation count: 515
H-index: 14
I10-index: 16
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