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Wael Zohni
Observed names:
W. Zohni,
Zohni, Wael
Observed institutions:
Superior Court of California,
Xperi (United States),
Silicon Valley University,
Samsung Semiconductor (United States),
Fair Isaac Corporation (United States)
OpenAlex ID:
A5062201156
Stacked chip scale packages: manufacturing issues, reliability results, and cost analysis
2004
·
J. Demmin
, D. Baker
, et al.
·
IEEE/CPMT International Electronics Manufacturing Technology Symposium
·
10
Manufacturing readiness of BVA technology for ultra-high bandwidth package-on-package
2014
·
Rajesh Katkar
, Rey Co
, et al.
·
IEEE Electronic Components and Technology Conference (ECTC)
·
7
High-Volume-Manufacturing (HVM) of BVA enabled advanced Package-on-Package (PoP)
2015
·
Rey Co
, Rajesh Katkar
, et al.
·
International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC)
·
5
Manufacturing Readiness of BVA™ Technology for Fine-Pitch Package-on-Package
2014
·
Rajesh Katkar
, Rey Co
, et al.
·
IMAPSource Proceedings
·
4
PDF
Cost-minimized double die DRAM packaging for ultra-high performance DDR3 and DDR4 multi-rank server DIMMs
2012
·
Richard Crisp
, Bill Gervasi
, et al.
·
International Symposium on Quality Electronic Design (ISQED)
·
3
High-volume-manufacturing (HVM) of BVA™ enabled advanced package-on-package (PoP)
2015
·
Rajesh Katkar
, Ashok Prabhu
, et al.
·
International Symposium on Next-Generation Electronics
·
1
A 1020-lead, 240 micron pitch, 14 × 14mm Package-on-Package (PoP) and manufacturing infrastructure
2014
·
Rajesh Katkar
, Rey Co
, et al.
·
International Conference on Electronics Packaging (ICEP)
·
1
High density SDRAM package solution for next generation product board applications
2012
·
Vern Solberg
, Simon McElrea
, et al.
·
Electronic System-Integration Technology Conference (ESTC)
·
1
Near term solutions for 3D packaging of high performance DRAM
2011
·
Vern Solberg
, Wael Zohni
·
IEEE Electronics Packaging Technology Conference (EPTC)
·
1
VI. Synthesis and Analysis
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
III. U.S. Patent Quality Today
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
II. Origins of the U.S. Patent System
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
V. Patent War Yesterday: Wright v Herring-Curtiss
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
VII. Proposals
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
Titelei/Inhaltsverzeichnis
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
Examining the Role of Patent Quality in Large-Scale "Patent War" Litigation
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
PDF
VIII. Conclusion
2018
·
Wael Zohni
·
Nomos Verlagsgesellschaft mbH & Co. KG eBooks
High-Volume-Manufacturing (HVM) of BVA Enabled Advanced Package-On-Package (POP)
2015
·
Rajesh Katkar
, Ashok S. Prabhu
, et al.
·
SMTA International
BVA™ Technology Enabling the Next Generation of Ultra-Fine Pitch Wide-Io Package-On-Package
2014
·
Rajesh Katkar
, Rey Co
, et al.
·
Wafer-Level Packaging Symposium
Manufacturing Readiness of BVA™ Technology for Fine-Pitch Package-on-Package
2014
·
Rajesh Katkar
, Rey Co
, et al.
·
SMTA International
Manufacturing Readiness of BVA(TM) Technology for Fine-Pitch Package-on-Package
2014
·
Wael Zohni
, Rajesh Katkar
, et al.
·
Additional Conferences (Device Packaging HiTEC HiTEN & CICMT)
Higher Density PoP Semiconductor Packaging Solution: Bridging the Infrastructure Gap Between Wire-Bond and TSV Interconnect
2013
·
Vern Solberg
, Belgacem Haba
, et al.
·
SMTA International
Bridging the infrastructure gap between traditional wire-bond and TSV semiconductor package technology
2013
·
Vern Solberg
, Belgacem Haba
, et al.
·
European Microelectronics and Packaging Conference
Thermal Analysis of xFD DRAM Packages Through Simulation and Experimental Validation
2013
·
Ron Zhang
, John Tseng
, et al.
·
Additional Conferences (Device Packaging HiTEC HiTEN & CICMT)
xFD: A Very Thin Two and Four Die Package Solution for High Performance DDR Sdram
2012
·
Vern Solberg
, Simon McElrea
, et al.
·
SMTA International
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Works count:
28
Citation count:
33
H-index:
4
I10-index:
1
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