Author

Thomas Stehrer

Observed names: Stehrer Thomas, T Stehrer, T. Stehrer
Institution: Fronius (Austria)
ORCID: 0009-0001-8519-2659
Observed ORCID: 0009-0001-8519-2659
OpenAlex ID: A5062541253
2019 · Matthias Kehrer, Jiri Duchoslav, et al. · Plasma Processes and Polymers · 241
2020 · Matthias Kehrer, Alena Rottensteiner, et al. · Surface and Coatings Technology · 80
2009 · T. Stehrer, B. Praher, et al. · Journal of Analytical Atomic Spectrometry · 50
2019 · Matthias Kehrer, Jiri Duchoslav, et al. · Surface and Coatings Technology · 45
2010 · T. Stehrer, J. Heitz, et al. · Analytical and Bioanalytical Chemistry · 33
2023 · Nikolaos Giannakaris, Gustav Gürtler, et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 32
2008 · R. Viskup, B. Praher, et al. · Applied Surface Science · 30
2008 · J.D. Pedarnig, J. Heitz, et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 29
2013 · T Kavka, A Mašláni, et al. · Journal of Physics D Applied Physics · 24
2013 · T Kavka, O Chumak, et al. · Journal of Physics D Applied Physics · 21
2017 · A Prylepa, C Reitböck, et al. · Journal of Physics D Applied Physics · 20
2014 · T Kavka, S Tossen, et al. · Journal of Physics Conference Series · 13
2008 · Johannes Heitz, Sergey Yakunin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2019 · J. Duchoslav, M. Kehrer, et al. · Applied Surface Science · 11
2024 · J. Duchoslav, A. Himmelbauer, et al. · Applied Surface Science · 8
2013 · A. Mašláni, V. Sember, et al. · Plasma Chemistry and Plasma Processing · 7
2008 · T. Brandstetter, M. Draxler, et al. · Physical Review B · 5
2006 · T. Stehrer, J. Heitz · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2008 · J. D. Pedarnig, K. Siraj, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Works count: 21
Citation count: 685
H-index: 13
I10-index: 15
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