Author

Henry T. Pearce-Percy

Observed names: H T Pearce-Percy, H. Pearce-Percy, H.T. Pearce-Percy, Henry Pearce-Percy
OpenAlex ID: A5063007622
1976 · H T Pearce-Percy · Journal of Physics E Scientific Instruments · 13
2011 · Anthony Zografos, Andy Hening, et al. · AIP conference proceedings · 6
1994 · Henry Pearce-Percy, Richard Prior, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
1992 · F. Abboud, M. Gesley, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 5
1997 · Frank E. Abboud, Charles A. Sauer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2011 · Robert W. Hamm, Henry T. Pearce-Percy, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 3
2002 · Thomas H. Newman, Ira Finklestein, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2000 · Jan M. Chabala, Suzanne Weaver, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
1999 · Jan M. Chabala, Frank E. Abboud, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
1997 · H. Pearce-Percy, F. Abboud, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 3
1979 · H.T. Pearce-Percy, D.F. Spicer, et al. · Journal of Vacuum Science and Technology · 3
2011 · R. Becker, R. W. Hamm, et al. · AIP conference proceedings · 2
2000 · Jan M. Chabala, Damon M. Cole, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
1998 · Marian Mankos, Lee H. Veneklasen, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
1975 · Henry T. Pearce-Percy · PhDT
1974 · H.T. Pearce-Percy · Proceedings annual meeting Electron Microscopy Society of America
Works count: 16
Citation count: 55
H-index: 4
I10-index: 1
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