Author

Valeria Rustichelli

Observed names: Rustichelli, V Valeria, Rustichelli, V., Rustichelli, Valeria, V. Rustichelli
Institution: IRT Saint Exupéry
ORCID: 0000-0002-6893-6898
Observed ORCID: 0000-0002-6893-6898
OpenAlex ID: A5063839022
2019 · Valeria Rustichelli, Cosimo Calo, et al. · IEEE Journal of Selected Topics in Quantum Electronics · 9
2025 · M. Alam, V. Rustichelli, et al. · Microelectronics Reliability · 8
2023 · M. Zerarka, V. Rustichelli, et al. · Microelectronics Reliability · 8
2018 · Florian Lemaître, Valeria Rustichelli, et al. · Physics and simulation of optoelectronic devices. Conference · 5
2025 · M.L. Dedew, S. Lefebvre, et al. · Microelectronics Reliability · 3
2025 · Maroun Alam, Valeria Rustichelli, et al. · Microelectronics Reliability · 2
2019 · Kevin A. Williams, Marija Trajkovic, et al. · Optical Interconnects and Packaging · 2
2026 · Thomas Vadebout, Pascal Bevilacqua, et al. · Microelectronics Reliability · 1
2026 · M. Millesimo, V. Volosov, et al. · IEEE Transactions on Power Electronics · 1
2016 · Rustichelli, V., Ambrosius, H.P.M.M., et al. · TU/e Research Portal · 1
2016 · Rustichelli, V Valeria, Ambrosius, HPMM Huub, et al. · TU/e Research Portal · 1
2026 · M. Millesimo, A. Terracina, et al. · Microelectronic Engineering
2026 · D. Stepins, J. Zakis, et al. · Latvian Journal of Physics and Technical Sciences
2026 · Razafimanjaka, Harold, Trémouilles, David, et al. · HAL
2025 · Maroun Alam, Valeria Rustichelli, et al. · Microelectronics Reliability
2025 · Diouf, Ababacar, Rustichelli, Valeria, et al. · HAL
2025 · Vadebout, Thomas, Bevilacqua, Pascal, et al. · HAL
2018 · Rustichelli, V Valeria, Lemaitre, FA Florian, et al. · TU/e Research Portal
Works count: 26
Citation count: 44
H-index: 4
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