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H. Dib
Observed name:
H Dib
Institution:
Université Djilali de Sidi Bel Abbès
Observed institution:
Université Djilali de Sidi Bel Abbès
OpenAlex ID:
A5064170033
Influence of the Thermal Annealing on the MOSP Structure
2009
·
H. Dib
, Z. Benamara
, et al.
·
Sensor Letters
·
2
C(V) characterization of metal/polysilicon/oxide/monosilicon structure
1999
·
H Dib
, Z Benamara
, et al.
·
Microelectronics Journal
·
2
Modeling and Characterization on SiC/Ti Schottky Diodes
2009
·
H. Mazari
, N. Benseddik
, et al.
·
Sensor Letters
·
1
Numerical Modeling and Simulation of Output Parameters in Poly-Si Homojunction nip (or pin) Solar Cells
2001
·
Baya Zebentout
, H. Sehil
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
1
Modelling of the Doping Effect on the Capacitance of the Metal/N-Polysilicon/Oxide/N-Silicon Structure
1999
·
H. Dib
, Z. Benamara
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
1
Interface States Densities Effect at SiO2/ Polysilicon and SiO2/ Monosilicon Surfaces on N-polysilicon /Oxide/ P-Monosilicon Capacitance
2014
·
H. Dib
, Z. Benamara
, et al.
·
DOAJ (DOAJ: Directory of Open Access Journals)
The Inversion Layer Evolution According to the Report of Substrat Doping /Gate Doping of a MSP OS Structure
2014
·
H. Dib
, Z. Benamara
, et al.
·
DOAJ (DOAJ: Directory of Open Access Journals)
THE INTERFACE STATES AT SiO2/POLYSILICON AND SiO2/MONOSILICON INTERFACE INFLUENCE ON N-POLYSILICON/OXIDE/N-MONOSILICON CAPACITANCE
2009
·
H. Dib
, Z. Benamara
, et al.
·
The African review of physics
Frequency effect on the metal/polysilicon/oxide/silicon capacitance
2006
·
H. Dib
, Z. Benamara
, et al.
·
Materials Science and Engineering C
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Works count:
9
Citation count:
7
H-index:
2
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