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Mehdi Baradaran Tahoori

Observed names: M B Tahoori, M. B. Tahoori, M. Baradaran Tahoori, M. Tahoori, M.B. Tahoori, Marco Ottavi, Mehdi B Tahoori, Mehdi B. Tahoori, Mehdi Tahoori, Prof. Dr. Mehdi Baradaran Tahoori, Tahoori Mehdi, Tahoori, Mehdi, Tahoori, Mehdi B., Tahoori, Mehdi Baradaran
Observed institutions: Karlsruhe Institute of Technology, Northeastern University, University of Patras, Aristotle University of Thessaloniki, University of Michigan, IMEC, Brno University of Technology, Ruhr University Bochum, Northeastern University, Stanford University, KU Leuven
ORCID: 0000-0002-8829-5610
Observed ORCIDs: 0000-0002-8829-5610, 0000-0002-5064-7342
OpenAlex ID: A5064445713
Evaluation of Hybrid Memory Technologies Using SOT-MRAM for On-Chip Cache Hierarchy
2015 · Fabian Oboril, Rajendra Bishnoi, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 218
Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing
2015 · Guillaume Prenat, Kevin Garello, et al. · IEEE Transactions on Multi-Scale Computing Systems · 194
Reliable on-chip systems in the nano-era: lessons learnt and future trends
2013 · Jörg Henkel, Lars Bauer, et al. · ACM/IEEE Design Automation Conference (DAC) · 193
An inside job: Remote power analysis attacks on FPGAs
2018 · Falk Schellenberg, Dennis R.E. Gnad, et al. · Design, Automation, and Test in Europe · 178
Testing of Quantum Cellular Automata
2004 · M.B. Tahoori, J. Huang, et al. · IEEE Transactions on Nanotechnology · 178
FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES
2018 · Jonas Krautter, Dennis R. E. Gnad, et al. · IACR Transactions on Cryptographic Hardware and Embedded Systems · 153
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Voltage drop-based fault attacks on FPGAs using valid bitstreams
2017 · Dennis R. E. Gnad, Fabian Oboril, et al. · International Conference on Field Programmable Logic and Applications (FPL) · 147
Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation
2005 · M. Momenzadeh, Jing Huang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 138
Defects and faults in quantum cellular automata at nano scale
2004 · M.B. Tahoori, M. Momenzadeh, et al. · IEEE VLSI Test Symposium (VTS) · 129
ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level
2012 · Fabian Oboril, Mehdi B. Tahoori · International Conference on Dependable Systems & Networks/Proceedings · 109
Balancing Performance and Reliability in the Memory Hierarchy
2005 · Ghazanfar-Hossein Asadi, Vilas Sridharan, et al. · IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS) · 106
Design and architectures for dependable embedded systems
2011 · Jörg Henkel, Lars Bauer, et al. · International Conference on Hardware/Software Codesign and System Synthesis · 93
Mitigating Electrical-level Attacks towards Secure Multi-Tenant FPGAs in the Cloud
2019 · Jonas Krautter, Dennis R. E. Gnad, et al. · ACM Transactions on Reconfigurable Technology and Systems · 85
Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs
2019 · Jonas Krautter, Dennis R.E. Gnad, et al. · 83
Soft error rate estimation and mitigation for SRAM-based FPGAs
2005 · Ghazanfar Asadi, Mehdi B. Tahoori · ACM/SIGDA International Symposium on Field-Programmable Gate Arrays (FPGA) · 83
Soft Error Susceptibility Analysis of SRAM-Based FPGAs in High-Performance Information Systems
2007 · Hossein Asadi, Mehdi B. Tahoori, et al. · IEEE Transactions on Nuclear Science · 82
Hybrid low-voltage physical unclonable function based on inkjet-printed metal-oxide transistors
2020 · Alexander Scholz, Lukas Zimmermann, et al. · Nature Communications · 78
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An Analytical Approach for Soft Error Rate Estimation in Digital Circuits
2005 · G. Asadi, M.B. Tahoori · IEEE International Symposium on Circuits and Systems proceedings · 76
Remote inter-chip power analysis side-channel attacks at board-level
2018 · Falk Schellenberg, Dennis R. E. Gnad, et al. · 75
Soft Error Mitigation for SRAM-Based FPGAs
2005 · G.-H. Asadi, M.B. Tahoori · IEEE VLSI Test Symposium (VTS) · 75
Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)
2011 · M Fazeli, S N Ahmadian, et al. · Design, Automation, and Test in Europe · 73
An Accurate SER Estimation Method Based on Propagation Probability
2005 · G. Asadi, M.B. Tahoori · Design, Automation, and Test in Europe · 73
Improving Write Performance for STT-MRAM
2016 · Rajendra Bishnoi, Mojtaba Ebrahimi, et al. · IEEE Transactions on Magnetics · 72
Read disturb fault detection in STT-MRAM
2014 · Rajendra Bishnoi, Mojtaba Ebrahimi, et al. · IEEE International Test Conference (ITC) · 71
Application-independent defect tolerance of reconfigurable nanoarchitectures
2006 · Mehdi B. Tahoori · ACM Journal on Emerging Technologies in Computing Systems · 67
Works count: 729
Citation count: 10,190
H-index: 48
I10-index: 275
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