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Jwu-E Chen
Observed names:
Chen Jwu-E,
Jwu E Chen,
Jwu E. Chen,
Jwu-E CHEN,
Jwu-E. Chen,
Jwu‐E Chen
show all 6
Institution:
National Central University
Observed institutions:
National Yang Ming Chiao Tung University,
National Chi Nan University,
National Central University,
Industrial Technology Research Institute,
Chung Hua University
ORCID:
0000-0002-7806-013X
Observed ORCID:
0000-0002-7806-013X
OpenAlex ID:
A5064869482
Machine Learning-Based Detection Method for Wafer Test Induced Defects
2021
·
Ken Chau-Cheung Cheng
, Leon Li-Yang Chen
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
62
Placement Optimization for Yield Improvement of Switched-Capacitor Analog Integrated Circuits
2010
·
Jwu-E. Chen
, Pei-Wen Luo
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
42
Impact of Capacitance Correlation on Yield Enhancement of Mixed-Signal/Analog Integrated Circuits
2008
·
Pei-Wen Luo
, Jwu-E Chen
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
38
Nested Quantization Index Modulation for Reversible Watermarking and Its Application to Healthcare Information Management Systems
2011
·
Lu-Ting Ko
, Jwu-E. Chen
, et al.
·
Computational and Mathematical Methods in Medicine
·
34
PDF
Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning
2022
·
Katherine Shu-Min Li
, Xu-Hao Jiang
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
30
A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design
2007
·
Shih-Ping Lin
, Chung-Len Lee
, et al.
·
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
·
30
Oscillation ring based interconnect test scheme for SOC
2005
·
Katherine Shu-Min Li
, Chung Len Lee
, et al.
·
Asia and South Pacific Design Automation Conference (ASP-DAC)
·
27
A Novel Fractional‐Discrete‐Cosine‐Transform‐Based Reversible Watermarking for Healthcare Information Management Systems
2012
·
Lu-Ting Ko
, Jwu-E Chen
, et al.
·
Mathematical Problems in Engineering
·
24
PDF
A fast and sensitive built-in current sensor for IDDQ testing
2002
·
Chih-Wen Lu
, Chung Len Lee
, et al.
·
19
Haar‐Wavelet‐Based Just Noticeable Distortion Model for Transparent Watermark
2011
·
Lu-Ting Ko
, Jwu-E Chen
, et al.
·
Mathematical Problems in Engineering
·
17
PDF
Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement
2020
·
Katherine Shu-Min Li
, Peter Yi-Yu Liao
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
16
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements
2019
·
Chung-Huang Yeh
, Jwu E. Chen
·
Journal of Electronic Testing
·
15
Histogram Modification and Wavelet Transform for High Performance Watermarking
2012
·
Ying-Shen Juang
, Lu-Ting Ko
, et al.
·
Mathematical Problems in Engineering
·
15
PDF
IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection
2007
·
Katherine Shu-Min Li
, Chung-Len Lee
, et al.
·
Journal of Electronic Testing
·
13
Behavior-level fault model for the closed-loop operational amplifier
2000
·
Yeong Jar Chang
, Chung Len Lee
, et al.
·
13
PACES: A Partition-Centering-Based Symmetry Placement for Binary-Weighted Unit Capacitor Arrays
2016
·
Chien-Chih Huang
, Jwu-E Chen
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
11
A Novel Fractional Discrete Cosine Transform Based Reversible Watermarking for Biomedical Image Applications
2012
·
Lu-Ting Ko
, Jwu-E Chen
, et al.
·
International Symposium on Computer, Consumer and Control
·
11
Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization
2022
·
Katherine Shu-Min Li
, Leon Li-Yang Chen
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
9
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis
2020
·
Ken Chau-Cheung Cheng
, Katherine Shu-Min Li
, et al.
·
Design, Automation, and Test in Europe
·
9
Test yield and quality analysis models of chips
2020
·
Chung Huang Yeh
, Jwu E Chen
·
Journal of the Chinese Institute of Engineers
·
9
Yield evaluation of analog placement with arbitrary capacitor ratio
2009
·
Jwu-E Chen
, Pei-Wen Luo
, et al.
·
International Symposium on Quality Electronic Design (ISQED)
·
9
Fault Diagnosis for Linear Analog Circuits
2001
·
Jun Weir Lin
, Chung Len Lee
, et al.
·
Journal of Electronic Testing
·
9
Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling
2021
·
Leon Li-Yang Chen
, Katherine Shu-Min Li
, et al.
·
Proceedings/Proceedings - International Test Conference
·
8
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing
2020
·
Chung-Huang Yeh
, Jwu E Chen
·
IEEE International Test Conference in Asia (ITC-Asia)
·
8
Development of an Emotional Robot as a Teaching Assistant
2009
·
Jwu-E Chen
, Lu-Tsou Yeh
, et al.
·
Lecture notes in computer science
·
8
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Works count:
75
Citation count:
627
H-index:
13
I10-index:
17
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