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Author

J.H. Wu

Observed names: Joy Wu, Joyce H. Wu
OpenAlex ID: A5065301751
An insulator-lined silicon substrate-via technology with high aspect ratio
2001 · J.H. Wu, J. Scholvin, et al. · IEEE Transactions on Electron Devices · 176
A Through-Wafer Interconnect in Silicon for RFICs
2004 · J.H. Wu, J. Scholvin, et al. · IEEE Transactions on Electron Devices · 70
A Faraday cage isolation structure for substrate crosstalk suppression
2001 · J.H. Wu, J. Scholvin, et al. · IEEE Microwave and Wireless Components Letters · 52
Fabrication and Characterization of Through-Substrate Interconnects
2010 · Joy Wu, Jesús A. del Alamo · IEEE Transactions on Electron Devices · 23
A high aspect-ratio silicon substrate-via technology and applications: through-wafer interconnects for power and ground and Faraday cages for SOC isolation
2002 · J.H. Wu, J.A. Del Alamo, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 20
Through-substrate interconnects for 3-D integration and RF systems
2006 · Joyce H. Wu · DSpace@MIT (Massachusetts Institute of Technology) · 16
Through-Substrate Interconnects for 3-D ICs, RF Systems, and MEMS
2007 · Joyce H. Wu, Jesus A. Del Alamo · IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) · 13
Design and modeling of Faraday cages for substrate noise isolation
2013 · Joyce H. Wu, Jesús A. del Alamo · Solid-State Electronics · 7
P‐84: Mechanical Reliability of Digital Micro Shutter (DMS™) Displays
2011 · Joyce H. Wu, J. Lodewyk Steyn, et al. · SID Symposium Digest of Technical Papers · 5
An equivalent circuit model for a Faraday cage substrate crosstalk isolation structure
2004 · J.H. Wu, J.A. del Alamo · Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium · 5
A high aspect-ratio silicon substrate-via technology and applications
2000 · Joyce H. Wu · DSpace@MIT (Massachusetts Institute of Technology) · 5
Reliability studies on MEMS shutters and displays
2013 · Joyce H. Wu, J. Lodewyk Steyn · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Works count: 13
Citation count: 396
H-index: 7
I10-index: 7
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