Author

H. J. Lee

2023 · Suhwan Lim, Taeyoung Kim, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 71
2023 · Sijung Yoo, Duk-Hyun Choe, et al. · Applied Physics Letters · 29
2024 · Sijung Yoo, Donghoon Kim, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 27
2013 · S. J. Sung, G. H. Jang, et al. · IEEE Transactions on Magnetics · 19
2011 · Thomas Cecil, Chris Ashton, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 15
2024 · Ilho Myeong, Suhwan Lim, et al. · IEEE International Reliability Physics Symposium proceedings · 14
2012 · S. J. Sung, G. H. Jang, et al. · IEEE Transactions on Magnetics · 11
2003 · W. K. Kwak, K. H. Lee, et al. · SID Symposium Digest of Technical Papers · 10
2021 · D.-H. Choe, H. Bae, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 4
2007 · C. -S. Oh, J. -S. Bae, et al. · Springer eBooks · 3
2026 · Sangjun Lee, Hyangsook Lee, et al. · Science Advances · 2
2025 · Hyun Jae Lee, Minji Sohn, et al. · IEEE Electron Device Letters · 2
2026 · Heesue Song, Juheon Kim, et al. · IEEE Access · 1
2024 · Dong-Seob Shin, Jong-Ho Park, et al. · International SoC Design Conference · 1
2024 · Taeyoung Kim, Suhwan Lim, et al. · IEEE International Reliability Physics Symposium proceedings · 1
2000 · S.S. Venkata, H. J. Lee · International journal of engineering intelligent systems for electrical engineering and communications · 1
2026 · Hyun Jae Lee, Eknath Sarkar, et al. · IEEE Electron Device Letters
2018 · H. J. Lee, Seung-Mook Baek · Journal of Fundamental and Applied Sciences
Works count: 18
Citation count: 211
H-index: 8
I10-index: 8
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