Author

Jürgen W. Czarske

Observed names: Czarske, J, Czarske, Jürgen, Czarske, Jürgen W., J CZARSKE, J Czarske, J. Czarske, J. W. Czarske, J.W Czarske, J.W. Czarske, Jrgen Czarske, Juergen Czarske, Juergen W Czarske, Juergen W. Czarske, Jurgen Czarske, Jurgen W. Czarske, Jürgen Czarske, Jürgen CZARSKE, Jürgen Czarske, Jürgen W Czarske, Jürgen Walter Czarske
ORCID: 0000-0001-7280-0523
Observed ORCID: 0000-0001-7280-0523
OpenAlex ID: A5065780800
2020 · Azaam Aziz, Stefano Pane, et al. · ACS Nano · 288
2018 · Raimund Schlüßler, Stephanie Möllmert, et al. · Biophysical Journal · 169
2020 · Giuseppe Antonacci, Timon Beck, et al. · Biophysical Reviews · 127
2022 · Jiawei Sun, Jiachen Wu, et al. · Light Science & Applications · 113
2014 · Nektarios Koukourakis, Markus Finkeldey, et al. · Optics Express · 75
2020 · Stefan Rothe, Qian Zhang, et al. · Journal of Lightwave Technology · 72
2006 · T Pfister, L Büttner, et al. · Measurement Science and Technology · 67
2021 · Robert Kuschmierz, Elias Scharf, et al. · Light Advanced Manufacturing · 58
2018 · Robert Kuschmierz, Elias Scharf, et al. · Optics Letters · 58
2012 · Mathias Neumann, Christian Friedrich, et al. · Journal of Physics D Applied Physics · 58
2012 · Jürgen Czarske · tm - Technisches Messen · 58
2022 · Qian Zhang, Stefan Rothe, et al. · APL Photonics · 56
2019 · Azaam Aziz, Mariana Medina‐Sánchez, et al. · Advanced Functional Materials · 55
2024 · Jiawei Sun, Bin Yang, et al. · Nature Communications · 52
2007 · Andreas Fischer, Lars Büttner, et al. · Measurement Science and Technology · 51
2020 · Stefan Rothe, Nektarios Koukourakis, et al. · Scientific Reports · 50
2016 · Nektarios Koukourakis, Bob Fregin, et al. · Optics Express · 48
2015 · Mathias Neumann, Florian Dreier, et al. · Mechanical Systems and Signal Processing · 48
2024 · Jiawei Sun, Robert Kuschmierz, et al. · PhotoniX · 47
2016 · Jürgen W. Czarske, Daniel Haufe, et al. · Optics Express · 47
2020 · Elias Scharf, Jakob Dremel, et al. · Optics Letters · 44
2016 · Katrin Philipp, André Smolarski, et al. · Optics Express · 40
Works count: 541
Citation count: 4,590
H-index: 35
I10-index: 133
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