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Author

Rudolf Ullmann

Observed names: R. Ullmann, Ullmann, R.
Observed institution: Infineon Technologies (Germany)
ORCID: 0009-0003-4341-473X
Observed ORCID: 0009-0003-4341-473X
OpenAlex ID: A5066406641
Highly Reliable Flash Memory with Self-Aligned Split-Gate Cell Embedded into High Performance 65nm CMOS for Automotive & Smartcard Applications
2012 · D. Shum, J. R. Power, et al. · IEEE International Memory Workshop (IMW) · 25
Recent Trends and Perspectives on Defect-Oriented Testing
2022 · P. Bernardi, R. Cantoro, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 11
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Robustness in automotive electronics: An industrial overview of major concerns
2017 · Ulrich Backhausen, Oscar Ballan, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 11
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
2022 · P. Bernardi, G. Insinga, et al. · IEEE European Test Symposium (ETS) · 8
Industrial best practice: cases of study by automotive chip- makers
2021 · L. Degli Abbati, R. Ullmann, et al. · Proceedings · 6
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
2024 · Paolo Bernardi, Augusto Maria Guerriero, et al. · Electronics · 4
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A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip
2019 · A. Manzini, P. Inglese, et al. · IEEE European Test Symposium (ETS) · 4
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Erratic bits classification for efficient repair strategies in automotive embedded flash memories
2013 · C. Zambelli, P. Olivo, et al. · IEEE International Reliability Physics Symposium proceedings · 4
Modeling Erratic Bits Temperature Dependence for Monte Carlo Simulation of Flash Arrays
2013 · Cristian Zambelli, Gert Koebernik, et al. · IEEE Electron Device Letters · 4
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip
2023 · G. Insinga, M. Battilana, et al. · IEEE European Test Symposium (ETS) · 3
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Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification
2013 · Cristian Zambelli, Gert Koebernik, et al. · IEEE Transactions on Device and Materials Reliability · 2
Late Breaking Results: A Data Compaction Strategy for Extensive Test Flows of Memories Embedded in Automotive SoCs
2025 · P. Bernardi, B. Borio, et al. · Design, Automation, and Test in Europe · 1
Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening
2014 · Andreas Kux, Rudolf Ullmann, et al. · IEEE International Test Conference (ITC) · 1
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis
2026 · Simone Anedda, Paolo Bernardi, et al. · IEEE European Test Symposium (ETS)
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Effective and Efficient Methodology to Classify Volumes of Large Memory Failure Bitmaps
2026 · Paolo Bernardi, Francesco Carpegna, et al. · IEEE Transactions on Emerging Topics in Computing
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories
2025 · Paolo Bernardi, Giorgio Insinga, et al. · ACM Transactions on Embedded Computing Systems
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A graph-based algorithm for NVM address decoders testing
2024 · Pierre Scaramuzza, Thomas Kern, et al. · IEEE International Test Conference (ITC)
Works count: 18
Citation count: 84
H-index: 5
I10-index: 3
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