Author

Yang‐Shun Fan

Observed name: Yang-Shun Fan
OpenAlex ID: A5066444526
2013 · Ching-Hui Hsu, Yang-Shun Fan, et al. · Applied Physics Letters · 67
2012 · Yang-Shun Fan, Po-Tsun Liu, et al. · Applied Physics Letters · 47
2014 · Po-Tsun Liu, Yang-Shun Fan, et al. · IEEE Electron Device Letters · 27
2014 · Yang-Shun Fan, Po-Tsun Liu · IEEE Transactions on Electron Devices · 27
2022 · Ko-Ruey Jen, Yi-Chien Chen, et al. · SID Symposium Digest of Technical Papers · 12
2024 · Kuan-Ju Zhou, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 7
2015 · Bogdan Govoreanu, Leqi Zhang, et al. · IEEE International Memory Workshop (IMW) · 6
2023 · Ya-Ting Chien, Kuan-Ju Zhou, et al. · IEEE Transactions on Electron Devices · 5
2013 · Po-Tsun Liu, Li-Wei Chu, et al. · ECS Transactions · 4
2014 · Chur‐Shyang Fuh, Po‐Tsun Liu, et al. · SID Symposium Digest of Technical Papers · 3
2014 · Po-Tsun Liu, Chur-Shyang Fuh, et al. · ECS Journal of Solid State Science and Technology · 3
2015 · Yang-Shun Fan, Wei-Liang Chan, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 2
2012 · Yang‐Shun Fan, Po‐Tsun Liu, et al. · SID Symposium Digest of Technical Papers · 2
2026 · Bo-Shen Huang, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 1
2012 · Po-Tsun Liu, Li-Wei Chu, et al. · ECS Meeting Abstracts · 1
2026 · Ya-Ting Chien, Yu-An Chen, et al. · IEEE Transactions on Device and Materials Reliability
2015 · Chih-Hsiang Chang, Yu-Chia Lai, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
2015 · Yang‐Shun Fan, Chih‐Hsiang Chang, et al. · SID Symposium Digest of Technical Papers
2013 · Chur‐Shyang Fuh, Po‐Tsun Liu, et al. · SID Symposium Digest of Technical Papers
2011 · Po‐Tsun Liu, Li‐Feng Teng, et al. · Opto-Electronics and Communications Conference (OECC)
2010 · Po‐Tsun Liu, Yi‐Teh Chou, et al. · SID Symposium Digest of Technical Papers
Works count: 26
Citation count: 340
H-index: 8
I10-index: 8
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