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Rahman Sajadi
Institution:
ON Semiconductor (United States)
Observed institutions:
ON Semiconductor (United States),
Pennsylvania State University,
The University of Texas at Dallas,
University of Tehran
ORCID:
0000-0002-3308-3215
Observed ORCID:
0000-0002-3308-3215
OpenAlex ID:
A5066564357
Selective Harmonic Elimination Technique With Control of Capacitive DC-Link Voltages in an Asymmetric Cascaded H-Bridge Inverter for STATCOM Application
2018
·
Rahman Sajadi
, Hossein Iman-Eini
, et al.
·
IEEE Transactions on Industrial Electronics
·
97
Improving the Reactive Current Compensation Capability of Cascaded H-Bridge Based STATCOM Under Unbalanced Grid Voltage
2019
·
Yousef Neyshabouri
, Sanjay K. Chaudhary
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
71
Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Transfer Characteristic With Temperature Compensation
2023
·
Masoud Farhadi
, Bhanu Teja Vankayalapati
, et al.
·
IEEE Transactions on Transportation Electrification
·
31
AC Power Cycling Test Setup and Condition Monitoring Tools for SiC-Based Traction Inverters
2023
·
Masoud Farhadi
, Bhanu Teja Vankayalapati
, et al.
·
IEEE Transactions on Vehicular Technology
·
28
PDF
A Practical Switch Condition Monitoring Solution for SiC Traction Inverters
2022
·
Bhanu Teja Vankayalapati
, Masoud Farhadi
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
21
Third Quadrant Operation of SiC MOSFETs: Comprehensive Analysis and Condition Monitoring Solution
2024
·
Rahman Sajadi
, Enes Ugur
, et al.
·
IEEE Transactions on Components Packaging and Manufacturing Technology
·
13
Model Based Junction Temperature Profile Control of SiC MOSFETs in DC Power Cycling for Accurate Reliability Assessments
2024
·
Bhanu Teja Vankayalapati
, Rahman Sajadi
, et al.
·
IEEE Transactions on Industry Applications
·
12
Reliability Evaluation of Isolated LDMOS Devices and Condition Monitoring Solution
2024
·
Rahman Sajadi
, Chi Xu
, et al.
·
IEEE Transactions on Components Packaging and Manufacturing Technology
·
7
Switching Transient-Based Junction Temperature Estimation of SiC MOSFETs With Aging Compensation
2024
·
Masoud Farhadi
, Rahman Sajadi
, et al.
·
IEEE Transactions on Power Electronics
·
6
Using variable DC sources in order to improve the voltage quality of a multilevel STATCOM with low frequency modulation
2016
·
Mohammad Kazem Bakhshizadeh
, Mohammad Najjar
, et al.
·
European Conference on Power Electronics and Applications
·
5
Gate Oxide and Package Reliability of TO-263 SiC MOSFETs
2025
·
Rahman Sajadi
, C. N. Muhammed Ajmal
, et al.
·
IEEE Transactions on Components Packaging and Manufacturing Technology
·
4
Small-Signal Analysis of Cascaded Multilevel H-Bridge Inverter for PV Integration
2021
·
Rahman Sajadi
, Javad Khazaei
·
North American Power Symposium (NAPS)
·
4
Active Fault Current Mitigation With Multi-Phase Inverter and Windings for Resilience Against Short-Circuit Faults Between Adjacent Turns
2024
·
Ahmad Daniar
, Matthew C. Gardner
, et al.
·
IEEE Transactions on Energy Conversion
·
3
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Works count:
13
Citation count:
302
H-index:
7
I10-index:
7
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