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Giorgi Muchaidze
Observed name:
G. Muchaidze
Observed institution:
Missouri University of Science and Technology
OpenAlex ID:
A5066941693
Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems
2008
·
Giorgi Muchaidze
, Jayong Koo
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
85
Frequency-Domain Measurement Method for the Analysis of ESD Generators and Coupling
2007
·
Jayong Koo
, Qing Cai
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
48
A measurement technique for ESD current spreading on a PCB using near field scanning
2009
·
Wei Huang
, David Pommerenke
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
28
Effect of Inhomogeneous Medium on Fields Above GCPW PCB for Near-Field Scanning Probe Calibration Application
2018
·
Shubhankar Marathe
, Morten Soerensen
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
25
Application and limits of IC and PCB scanning methods for immunity analysis
2007
·
David Pommerenke
, Giorgi Muchaidze
, et al.
·
International Zurich Symposium on Electromagnetic Compatibility (EMC Zurich)
·
21
Finding the Root Cause of an ESD Upset Event
2006
·
David Pommerenke
, Ja-Yong Koo
, et al.
·
18
ESD susceptibility characterization of an EUT by using 3D ESD scanning system
2006
·
Kai Wang
, Jayong Koo
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
16
Probe characterization and data process for current reconstruction by near field scanning method
2010
·
Wei Huang
, Dazhao Liu
, et al.
·
Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
·
11
Automated near-field scanning to identify resonances
2008
·
Giorgi Muchaidze
, Huang Wei
, et al.
·
International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)
·
9
Near field probe for detecting resonances in EMC application
2010
·
Jiang Xiao
, Dazhao Liu
, et al.
·
Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
·
8
Developing a universal exchange format for near-field scan data
2009
·
John Shepherd
, Atsushi Nakamura
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
2
Local probe injection compared to direct ESD injection
2009
·
Min Jin
, David Pommerenke
, et al.
·
2
A novel method for the analysis of ESD generators and coupling using frequency domain
2006
·
Qing Cai
, Jayong Koo
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
2
Corrections to “Effect of Inhomogeneous Medium on Fields Above GCPW PCB for Near-Field Scanning Probe Calibration Application”
2019
·
Shubhankar Marathe
, Hamed Kajbaf
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
Susceptibility scanning system as failure analysis tool for system level ESD problems
2007
·
Giorgi Muchaidze
Ability and Limit of using commercial SMT Inductors as probes for Immunity and Emissions Near field scanning
2007
·
Giorgi Muchaidze
, Ja-Yong Koo
, et al.
Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems
2007
·
Giorgi Muchaidze
, Ja‐Yong Koo
, et al.
Calculation of 3D capacitances of wires with hybrid MoM/MAS approach
2004
·
D. Karkashadze
, R. Jobava
, et al.
·
Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory
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Works count:
19
Citation count:
275
H-index:
9
I10-index:
8
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