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Author

Luca Barbisan

Observed names: BARBISAN, LUCA, Barbisan, L, L. Barbisan
Institution: KLA (United States)
ORCID: 0000-0002-1982-4443
Observed ORCID: 0000-0002-1982-4443
OpenAlex ID: A5067573436
Silicon phase transitions in nanoindentation: Advanced molecular dynamics simulations with machine learning phase recognition
2023 · Guojia Ge, Fabrizio Rovaris, et al. · Acta Materialia · 51
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The origin and nature of killer defects in 3C-SiC for power electronic applications by a multiscale atomistic approach
2020 · Emilio Scalise, Luca Barbisan, et al. · Journal of Materials Chemistry C · 28
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Molecular dynamics simulations of extended defects and their evolution in 3C–SiC by different potentials
2019 · Andrey Sarikov, Anna Marzegalli, et al. · Modelling and Simulation in Materials Science and Engineering · 27
Thermodynamic driving force in the formation of hexagonal-diamond Si and Ge nanowires
2021 · E. Scalise, A. Sarikov, et al. · Applied Surface Science · 15
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Structure and Stability of Partial Dislocation Complexes in 3C-SiC by Molecular Dynamics Simulations
2019 · Andrey Sarikov, Anna Marzegalli, et al. · Materials · 15
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Atomic-scale insights on the formation of ordered arrays of edge dislocations in Ge/Si(001) films via molecular dynamics simulations
2022 · Luca Barbisan, Anna Marzegalli, et al. · Scientific Reports · 14
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Mechanism of stacking fault annihilation in 3C-SiC epitaxially grown on Si(001) by molecular dynamics simulations
2021 · Andrey Sarikov, Anna Marzegalli, et al. · CrystEngComm · 10
Nature and Shape of Stacking Faults in 3C‐SiC by Molecular Dynamics Simulations
2021 · Luca Barbisan, Andrey Sarikov, et al. · physica status solidi (b) · 6
Evolution and Intersection of Extended Defects and Stacking Faults in 3C‐SiC Layers on Si (001) Substrates by Molecular Dynamics Simulations: The Forest Dislocation Case
2022 · Luca Barbisan, Emilio Scalise, et al. · physica status solidi (b) · 5
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Defectivity-aware EUV process window characterization for monolithic complementary FET HAR and 3D patterning
2025 · Hongcheon Yang, Min-Soo Kim, et al. · International Conference on Extreme Ultraviolet Lithography · 1
Process Control Solutions for GaN-on-Si Devices in a Production Line
2024 · Francesco F. Carboni, Luca M. Perego, et al. · ASMC proceedings · 1
Advanced Defects Study and Monitoring in New Generation 4H-SiC Devices
2026 · Nicolo Piluso, Cristiano Calabretta, et al. · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum
Evolution and Intersection of Extended Defects and Stacking Faults in 3C‐SiC Layers on Si (001) Substrates by Molecular Dynamics Simulations: The Forest Dislocation Case
2022 · Luca Barbisan, Emilio Scalise, et al. · physica status solidi (b)
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Nanostructured 3C-SiC on Si by a network of (111) platelets: a fully textured film generated by intrinsic growth anisotropy
2022 · G. M. Vanacore, D. Chrastina, et al. · Physical Chemistry Chemical Physics
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EDA framework development for the simulation of field-coupled nanocomputing circuits
2021 · Luca Barbisan
Vacancy-mediated climbing motion of dislocations in Ge/Si films: atomic-scale insights via molecular dynamics
2021 · Luca Barbisan, Anna Marzegalli, et al. · BOA (University of Milano-Bicocca)
Multiple stacking fault formation via the evolution of related dislocations by molecular dynamics simulations
2019 · Luca Barbisan, Anna Marzegalli, et al. · BOA (University of Milano-Bicocca)
Works count: 19
Citation count: 173
H-index: 7
I10-index: 7
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