Author

Alexander Kraetge

2008 · A. Kraetge, M. Kruger, et al. · International Conference on Condition Monitoring and Diagnosis (CMD) · 35
2013 · Alexander Kraetge, Stefan Hoek, et al. · IEEE Transactions on Dielectrics and Electrical Insulation · 30
2008 · K. Rethmeier, M. Kruger, et al. · International Conference on Condition Monitoring and Diagnosis (CMD) · 22
2012 · S.M. Hoek, M. Koch, et al. · IEEE International Symposium on Electrical Insulation · 19
2010 · Alexander Kraetge, Stefan Hoek, et al. · IEEE International Symposium on Electrical Insulation · 17
2010 · Alexander Kraetge, Kay Rethmeier, et al. · IEEE PES Transmission and Distribution Conference and Exhibition · 17
2012 · S.M. Hoek, A. Kraetge, et al. · IEEE International Symposium on Electrical Insulation · 15
2009 · Michael Krüger, A. Kraetge, et al. · 13
2014 · Stefan M. Hoek, Michael Krüger, et al. · e+i Elektrotechnik und Informationstechnik · 9
2012 · S. M. Hoek, A. Kraetge, et al. · IEEE International Conference on Condition Monitoring and Diagnosis · 9
2012 · S. M. Hoek, A. Kraetge, et al. · IEEE International Conference on Condition Monitoring and Diagnosis · 7
2008 · K. Rethmeier, A. Kraetge, et al. · IEEE International Symposium on Electrical Insulation · 6
2009 · S. M Hoek, W. Weissenberg, et al. · International Conference on Properties and Applications of Dielectric Materials (ICPADM) · 5
2008 · Michael Kruger, Maik Koch, et al. · International Conference on Condition Monitoring and Diagnosis (CMD) · 4
2012 · A. Kraetge, S. Hoek, et al. · IEEE International Conference on Condition Monitoring and Diagnosis · 3
2010 · Alexander Kraetge, Stefan Hoek, et al. · IEEE International Symposium on Electrical Insulation · 2
2009 · Michael Krüger, Maik Koch, et al. · Energetyka · 2
2009 · Michael Krüger, A. Kraetge, et al.
Works count: 22
Citation count: 217
H-index: 9
I10-index: 8
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