Author

N. Doukhane

Institution: University of Jijel

Observed institution: University of Jijel

OpenAlex ID: A5068772641

Frequency- and doping-level influence on electric and dielectric properties of PolySi/SiO2/cSi (MOS) structures

2018 · N. Doukhane, B. Birouk · Applied Physics A · 15

Works count: 1

Citation count: 15

H-index: 1

I10-index: 1