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Da-Wei Lai
Observed institution:
NXP (Netherlands)
ORCID:
0000-0002-4087-7988
Observed ORCID:
0000-0002-4087-7988
OpenAlex ID:
A5068991059
High-Voltage ESD Protection Device With Fast Transient Reaction and High Holding Voltage
2019
·
Da-Wei Lai
, Gijs de Raad
, et al.
·
IEEE Transactions on Electron Devices
·
17
Bidirectional ESD Protection Device Using PNP With pMOS-Controlled Nwell Bias
2018
·
Da-Wei Lai
, Gijs de Raad
, et al.
·
IEEE Electron Device Letters
·
16
PNP-eSCR ESD protection device with tunable trigger and holding voltage for high voltage applications
2016
·
Da-Wei Lai
, Shuang Zhao
, et al.
·
Electrical Overstress/Electrostatic Discharge Symposium
·
10
Gate-Lifted nMOS ESD Protection Device Triggered by a p-n-p in Series With a Diode
2019
·
Da-Wei Lai
, Stephen Sque
, et al.
·
IEEE Transactions on Electron Devices
·
5
DNW-Controllable triggered voltage of the integrated diode triggered SCR (IDT-SCR) ESD protection device
2017
·
Da-Wei Lai
, Wei-Jhih Tseng
, et al.
·
Electrical Overstress/Electrostatic Discharge Symposium
·
2
RC-Triggered Silicon Controlled Rectifier-based ESD Clamp with Fast Transient Reaction
2023
·
Lingran Pan
, Wenwen Zhang
, et al.
·
China Semiconductor Technology International Conference (CSTIC)
A 3-Terminal HV-ESD Protection as Specialized Solution for EDn-MOSTs that Directly Link Two External Pads
2019
·
Gijs de Raad
, Da-Wei Lai
·
Annual EOS/ESD Symposium (EOS/ESD)
Electrical Properties of CMOS Devices with Cu Local Interconnects
2002
·
Byung Jin Cho
, Haowei Xie
, et al.
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Works count:
8
Citation count:
50
H-index:
4
I10-index:
3
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