Get started
Author

H. Fujiwara

Partial scan design methods based on internally balanced structure
2002 · T. Takasaki, T. Inoue, et al. · Asia and South Pacific Design Automation Conference (ASP-DAC) · 16
A method of test generation for path delay faults using stuck-at fault test generation algorithms
2003 · S. Ohtake, K. Ohtani, et al. · Design, Automation, and Test in Europe · 7
Optimal granularity of test generation in a distributed system
2003 · H. Fujiwara, T. Inoue · International Conference on Computer Aided Design · 4
A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability
2002 · S. Ohtake, S. Nagai, et al. · Asia and South Pacific Design Automation Conference (ASP-DAC) · 3
Works count: 4
Citation count: 30
H-index: 3
I10-index: 1
Year
Topic
Type