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I. F. Mikhailov

Observed names: I F Mikhaĭlov, I.F Mikhailov, I.F. Mikhailov, I.F. Mykhaylov, I. F. Mikhailov, Igor F. Mikhailov, Igor Fedorovych Mikhailov, Igor Mikhailov, Mikhailov, I. F., Mikhailov, I.F., Mikhailov, Igor, Михайлов, Игорь Федорович
Observed institutions: P.N. Lebedev Physical Institute of the Russian Academy of Sciences, Russian Academy of Sciences, National Academy of Sciences of Ukraine, Physico-Technical Institute, B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine, Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences, National Technical University "Kharkiv Polytechnic Institute"
ORCID: 0000-0002-1332-5352
Observed ORCID: 0000-0002-1332-5352
OpenAlex ID: A5069089450
Determination of coal ash content by the combined x-ray fluorescence and scattering spectrum
2018 · I. F. Mikhailov, A. A. Baturin, et al. · Review of Scientific Instruments · 22
Perspectives of development of X-ray analysis for material composition
2016 · I.F Mikhailov, , 21 Frunze Str., 61002 Kharkiv, Ukraine · Functional materials · 22
In situ X-ray investigations of thin film growth
1998 · A.M. Baranov, I.F. Mikhailov · Thin Solid Films · 18
X‐ray Monitoring System for in situ Investigation of Thin Film Growth
1995 · I. F. Mikhailov, V. I. Pinegin, et al. · Crystal Research and Technology · 14
Dependence of the Compton to Rayleigh intensity ratio on the scatterer atomic number in the range of 4(Be) to 31(Ga)
2019 · I.F. Mikhailov, A.A. Baturin, et al. · X-Ray Spectrometry · 11
Structure and Phase Formation Features of Ti-Zr-Ni Quasicrystalline Films under Heating
2019 · S. V. Malykhin, V. V. Kondratenko, et al. · Journal of Nano- and Electronic Physics · 11
Method for the identification of substances by the ratio of the intensity of coherent to incoherent scattering
2020 · I.F. Mikhailov, A.I. Mikhailov, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 10
Determination of binary systems based on light elements by the ratio of the Compton and Rayleigh scattering intensities
2020 · Igor F. Mikhailov, Alexey A. Baturin, et al. · X-Ray Spectrometry · 9
Features of the Initial Stage of the Formation of Ti-Zr-Ni Quasicrystalline Thin Films
2020 · S. V. Malykhin, , 2, Kyrpychova St., 61002 Kharkiv, Ukraine, et al. · Journal of Nano- and Electronic Physics · 9
Detection limits of impurities in a light filler in an X-ray fluorescent arrangement with a secondary target
2012 · I. F. Mikhailov, A. A. Baturin, et al. · Instruments and Experimental Techniques · 8
Investigation of surface and superthin layers using x-ray methods
1995 · Igor F. Mikhailov, Svetlana S. Borisova, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
Growth Morphology and Structure Peculiarities of Superthin Titanium Films
1993 · I. F. Mikhailov, S. S. Borisova, et al. · Crystal Research and Technology · 7
Light element depth distribution by the intensity ratio of incoherent and coherent scattering
2019 · I.F. Mikhailov, A.A. Baturin, et al. · X-Ray Spectrometry · 6
Real-time monitoring of diamond-like film growth by x-ray diffraction
1995 · Alexander M. Baranov, V. V. Sleptsov, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
Crystal Structure and Growth Morphology of Nickel Superthin Films
1992 · I. F. Mikhailov, S. S. Borisova, et al. · Crystal Research and Technology · 6
Coherency of the interphase boundary and elastic strain in the epitaxial system Ge/GaAs
1983 · O. G. Alaverdova, M. Ya. Fuks, et al. · physica status solidi (a) · 6
Method for determining the electronegativity of bound atoms of chemical elements with a small atomic number
2023 · Igor F. Mikhailov, Anton I. Mikhailov · Review of Scientific Instruments · 5
Investigation of superthin carbon layers and multilayer carbon structures by x-ray reflectivity measurements
1996 · Alexander M. Baranov, Sergei A. Tereshin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
X-ray fluorescent method for the analysis of trace elements in bio-materials with correction of the matrix effect
2023 · Igor F. Mikhailov, Anton I. Mikhailov, et al. · Review of Scientific Instruments · 4
Показники інтенсивності рентгенофлюоресценції вмісту капсул металевих осколків м’яких тканин у поранених із вибуховою і вогнепальною травмою
2022 · I.A. Lurin, V.V. Boyko, et al. · EMERGENCY MEDICINE · 4
Investigation Of Superpolished Surfaces By X-Ray Scattering
1989 · A. V. Vinogradov, I. A. Artyukov, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Determination of the screening parameter for 1 s electrons in a bound atom by the ratio of the intensities of coherent and incoherent scattering of X‐rays
2021 · Igor F. Mikhailov, Sergey V. Surovitskiy, et al. · X-Ray Spectrometry · 3
Effect of bismuth nanolayers on the oriented growth of fullerene C60 on an amorphous substrate
2004 · V. E. Pukha, V. V. Varganov, et al. · Physics of the Solid State · 3
Stoichiometric defects and volume diffusion in epitaxial PbTe‐SnTe multilayers
1994 · A. G. Fedorov, E. V. Galkina, et al. · Crystal Research and Technology · 3
Reflectivity Measurements Of Multilayer X-Ray Mirrors At Normal Incidence
1989 · A. V. Vinogradov, I. V. Kozhevnikov, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
Works count: 76
Citation count: 233
H-index: 9
I10-index: 7
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