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Matthieu Pommiès
Observed names:
M Pommies,
M. Pommies,
M. Pommiès,
M. Pommiés,
Matthieu Pommies
Institution:
ALPhANOV (France)
Observed institutions:
Universidad de Valladolid,
Commissariat à l'Énergie Atomique et aux Énergies Alternatives,
Fraunhofer Institute for Applied Optics and Precision Engineering,
CEA Le Ripault,
ALPhANOV (France),
Alcatel-Lucent (France)
show all 6
ORCID:
0000-0001-5953-7169
Observed ORCID:
0000-0001-5953-7169
OpenAlex ID:
A5069988968
Impurities detection by optical techniques in KH2PO4 crystals
2007
·
M. Pommiès
, D. Damiani
, et al.
·
Optics Communications
·
50
Detection and characterization of absorption heterogeneities in KH2PO4 crystals
2006
·
M. Pommiès
, D. Damiani
, et al.
·
Optics Communications
·
35
SOCRATE: an optical bench dedicated to the understanding and improvement of a laser conditioning process
2006
·
Bertrand Bertussi
, Hervé Piombini
, et al.
·
Applied Optics
·
22
High-energy laser experiments for vulnerability studies in the context of the European TALOS program
2022
·
Maximilian Taillandier
, Raymond Peiffer
, et al.
·
High-Power Lasers and Technologies for Optical Countermeasures
·
13
Cation intermixing at quantum well/barriers interfaces in aged AlGaAs-based high-power laser diodes bars
2005
·
M. Pommiès
, M. Avella
, et al.
·
Applied Physics Letters
·
11
Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations
2023
·
Raphael Viera
, Jean-Max Dutertre
, et al.
·
Journal of Cryptographic Engineering
·
10
Revisited thermal approach to model laser-induced damage and conditioning process in KH 2 PO 4 and D 2x KH 2(1-x) PO 4 crystals
2006
·
Anthony Dyan
, Matthieu Pommiès
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
10
Gradual degradation in 980 nm InGaAs/AlGaAs pump lasers
2002
·
M. Bettiati
, C. Starck
, et al.
·
Materials Science and Engineering B
·
9
Study of the degradation of AlGaAs-based high-power laser bars: V defects
2007
·
A. Martín-Martín
, M. Avella
, et al.
·
Journal of Materials Science Materials in Electronics
·
8
Laser conditioning of KDP crystals using excimer and Nd:YAG lasers
2006
·
B. Bertussi
, D. Damiani
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
8
Cathodoluminescence degradation signatures of AlGaAs‐based high‐power laser arrays
2005
·
M. Pommiès
, M. Avella
, et al.
·
physica status solidi (a)
·
8
Cathodoluminescence spectral imaging as a technique for the study of cavity degradation of high-power QW lasers
2006
·
M. Avella
, M. Pommiés
, et al.
·
Materials Science in Semiconductor Processing
·
7
Duality safety/efficiency for laser directed energy weapon applications
2023
·
Maximilian Taillandier
, Raymond Peiffer
, et al.
·
6
On the validation of a priori estimates of standard displacement uncertainties in T3-stereocorrelation
2020
·
C Minguet
, F Soulas
, et al.
·
Measurement Science and Technology
·
6
Direct evidence for group III atoms migration in aged 980 nm InGaAs/AlGaAs pump lasers
2003
·
M. Bettiati
, F. Laruelle
, et al.
·
physica status solidi (a)
·
6
Development of Thermal Spray Alumina Coating for High Diffuse Reflectivity Application in Lambertian Screen
2023
·
Geoffrey Darut
, Christophe Verdy
, et al.
·
Journal of Thermal Spray Technology
·
5
PDF
Screening of high-power diode laser bars by optical scanning
2005
·
Tran Quoc Tien
, Axel Gerhardt
, et al.
·
Applied Physics Letters
·
5
Structural study of large scale KDP crystals using high energy X-ray diffraction
2005
·
Audrey Surmin
, François Guillet
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
5
Detection and localization of degradation damaged regions in 1.3 μm laser diodes on InP using low-coherence reflectometry
2001
·
Y. Gottesman
, M. Pommiès
, et al.
·
Materials Science and Engineering B
·
5
Reverse-Engineering and Data Extraction from SRAM using Photon Emission Analysis
2024
·
Rodrigo Silva Lima
, Raphael Viera
, et al.
·
IEEE Physical Assurance and Inspection of Electronics (PAINE)
·
4
Characterization tools for KDP/DKDP crystals investigation: toward the identification of laser-damage precursors: Part A. Structural characteristics of rapidly grown crystals
2006
·
A. Surmin
, F. Guillet
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Influence of the cut angle on the laser damage threshold of KDP
2005
·
Hervé Piombini
, Matthieu Pommies
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Nondestructive optical characterization of KH 2 PO 4 crystals heterogeneities and adapted excimer laser conditioning process
2005
·
Matthieu Pommiès
, David Damiani
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Localized laser damage test facility at LOSCM: real-time optical observation and quantitative AFM study
1998
·
Jean-Yves Natoli
, Patricia Volto
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Target Preparation Methodology for Semi-Invasive Attacks on Microcontrollers
2022
·
Rodrigo Silva Lima
, Raphael Viera
, et al.
·
IEEE Physical Assurance and Inspection of Electronics (PAINE)
·
3
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Works count:
35
Citation count:
270
H-index:
8
I10-index:
7
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