Get started
Author

Thales Augusto Ribeiro

Observed names: T A Ribeiro, T. A. Ribeiro, T. A. Ribeiro, T.A. Ribeiro, Thales A. Ribeiro, Thales Ribeiro
Observed institution: Centro Universitário FEI
ORCID: 0000-0002-7474-3208
Observed ORCID: 0000-0002-7474-3208
OpenAlex ID: A5070729374
Compact modeling of triple gate junctionless MOSFETs for accurate circuit design in a wide temperature range
2019 · Marcelo Antonio Pavanello, Antonio Cerdeira, et al. · Solid-State Electronics · 11
Analysis of the Electrical Parameters of SOI Junctionless Nanowire Transistors at High Temperatures
2021 · Thales Augusto Ribeiro, Sylvain Barraud, et al. · IEEE Journal of the Electron Devices Society · 9
PDF
Improved operation of graded-channel SOI nMOSFETs down to liquid helium temperature
2016 · Marcelo Antonio Pavanello, Michelly de Souza, et al. · Semiconductor Science and Technology · 5
Pragmatic evaluation of fin height and fin width combined variation impact on the performance of junctionless transistors
2022 · Thales Augusto Ribeiro, Antonio Cerdeira, et al. · Journal of Computational Electronics · 4
Detailed analysis of transport properties of FinFETs through Y-Function method: Effects of substrate orientation and strain
2015 · T. A. Ribeiro, E. Simoen, et al. · Symposium on Microelectronics Technology and Devices · 4
Simulation Analysis of the Fin Height Influence on the Electrical Parameters of Junctionless Nanowire Transistors
2018 · Thales Augusto Ribeiro, Antonio Cerdeira, et al. · ECS Transactions · 3
PDF
Analysis of bulk and accumulation mobilities in n- and p-type triple gate junctionless nanowire transistors
2017 · T. A. Ribeiro, M. A. Pavanello, et al. · Symposium on Microelectronics Technology and Devices · 3
Influence of fin width variation on the electrical characteristics of n-type junctionless nanowire transistors at high temperatures
2021 · Thales Augusto Ribeiro, Flávio Enrico Bergamaschi, et al. · Solid-State Electronics · 2
Analytical Compact Model for Transcapacitances of Junctionless Nanowire Transistors
2021 · Marcelo A. Pavanello, Thales A. Ribeiro, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 2
Influence of Fin Width Variation on the Electrical Characteristics of n-Type Junctionless Nanowire Transistors at High Temperatures
2020 · Thales Augusto Ribeiro, Sylvain Barraud, et al. · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon · 2
Experimental Demonstration of Ω-Gate SOI Nanowire MOS Transistors’ Mobility Variation Induced by Substrate Bias
2022 · F. E. Bergamaschi, T. A. Ribeiro, et al. · IEEE Transactions on Electron Devices · 1
Analysis of the Electrical Parameters in SOI n-type Junctionless Nanowire Transistors at High Temperatures
2020 · T. A. Ribeiro, M. A. Pavanello · IEEE Latin American Electron Devices Conference (LAEDC) · 1
Carrier Mobility Variation Induced by the Substrate Bias in Ω-gate SOI Nanowire MOSFETs
2019 · F. E. Bergamaschi, T. A. Ribeiro, et al. · IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference · 1
Analysis of the Scattering Mechanisms in the Accumulation Layer of Junctionless Nanowire Transistors at High Temperature
2019 · T.A. Ribeiro, M. A. Pavanello · Symposium on Microelectronics Technology and Devices · 1
Avaliação do desempenho do transistor MOS sem junções configurado como Nanofio ou FINFET
2020 · Thales Ribeiro
PDF
Avaliação do desempenho do transistor MOS sem junções configurado como Nanofio ou FINFET
2020 · T. A. Ribeiro
PDF
Simulation Analysis of the FIN Height Influence on the Electrical Parameters of Junctionless Nanowire Transistors
2018 · Thales Augusto Ribeiro, Antonio Cerdeira, et al. · ECS Meeting Abstracts
Analysis of carrier mobility in triple gate SOI nFinFET combining rotated substrate and strain
2016 · T. A. Ribeiro, E. Simoen, et al. · Symposium on Microelectronics Technology and Devices
回転基板と歪を組み合わせた三重ゲートSOI nFinFETにおけるキャリア移動度の解析【Powered by NICT】
2016 · T A Ribeiro, E Simoen, et al. · IEEE Conference Proceedings
Impacto da rotação do substrato sobre as características elétricas de FINFETS de porta tripla
2016 · T. A. Ribeiro
PDF
Works count: 20
Citation count: 49
H-index: 4
I10-index: 1
Year
Topic
Type