Author

Joachim Bamberg

Observed names: Bamberg, J., Bamberg, Joachim, J Bamberg, J. Bamberg
ORCID: 0000-0002-8204-0035
Observed ORCID: 0000-0002-8204-0035
OpenAlex ID: A5070953715
2007 · G. Zenzinger, J. Bamberg, et al. · Nondestructive Testing And Evaluation · 103
2015 · Guenter Zenzinger, Joachim Bamberg, et al. · AIP conference proceedings · 101
2015 · Hans Rieder, Alexander Dillhöfer, et al. · AIP conference proceedings · 76
2016 · Hans Rieder, Martin Spies, et al. · AIP conference proceedings · 65
2015 · Joachim Bamberg, Karl-Heinz Dusel, et al. · AIP conference proceedings · 29
2022 · Frederik Elischberger, Joachim Bamberg, et al. · IEEE Transactions on Instrumentation and Measurement · 23
2018 · A. Gögelein, A. Ladewig, et al. · International Conference on Quantitative InfraRed Thermography (QIRT) · 21
2009 · S. Hillmann, H. Heuer, et al. · AIP conference proceedings · 19
2004 · Bernd R. Müller, Axel Lange, et al. · Materials Testing · 13
2005 · Bernd R. Mueller, Axel Lange, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
2014 · Sebastian Hubel, Alexander Dillhöfer, et al. · AIP conference proceedings · 7
2013 · Marek Rjelka, Martin Barth, et al. · Materials science forum · 6
2010 · B. Köhler, M. Barth, et al. · AIP conference proceedings · 6
2006 · J. Bamberg · AIP conference proceedings · 5
2012 · M. Rjelka, M. Barth, et al. · AIP conference proceedings · 4
2012 · M. Barth, M. Küttner, et al. · AIP conference proceedings · 4
1988 · J Bamberg · Solid State Ionics · 3
1984 · J. Bamberg, H. Schmitt · Ferroelectrics · 3
1982 · J. Bamberg, H. Schmitt, et al. · Review of Scientific Instruments · 3
1999 · Joachim Bamberg, Christian Schwaminger · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
1993 · Joachim Bamberg, Heinz Schmitt · Review of Progress in Quantitative Nondestructive Evaluation · 1
Works count: 56
Citation count: 576
H-index: 10
I10-index: 11
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