Author

Seyed moein Ghafoori

Observed name: Seyed Moein Ghafoori
OpenAlex ID: A5070999072
2021 · Seyed Moein Ghafoori, Lukas Bahrenberg, et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 1
2014 · Seyed moein Ghafoori, Mojtaba Taghi pour Kaffash, et al.
Works count: 3
Citation count: 1
H-index: 1
I10-index:
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