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Elena Ioana Vatajelu

Observed names: E I Vatajelu, E. I. Vatajelu, E. Ioana Vatajelu, E. Vatajelu, E.-I. Vatajelu, Elena I. Vatajelu, Elena I. Vătăjelu, Elena-Ioana Vatajelu, Elena‐Ioana Vatajelu, I Vatajelu, I. Vatajelu, Ioana Vatajelu, Ioana Vatajelu, Elena, VATAJELU, ELENA IOANA, Vatajelu Elena Ioana, Vatajelu, Elena Ioana, Vatajelu, Elena, Ioana, Vatajelu, Elena-Ioana, Vatajelu, I., Vatajelu, Ioana, Vatajelu, Ioana,
Observed institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Technical University of Cluj-Napoca, Politecnico di Torino, Université de Montpellier, Techniques of Informatics and Microelectronics for Integrated Systems Architecture, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, Université Montpellier 2, University of Turin, Université Grenoble Alpes, Universitat Politècnica de Catalunya
ORCID: 0000-0002-4588-1812
Observed ORCID: 0000-0002-4588-1812
OpenAlex ID: A5071009840
Domino logic designs for high-performance and leakage-tolerant applications
2012 · Farshad Moradi, Tuan Vu Cao, et al. · Integration · 70
Challenges and Solutions in Emerging Memory Testing
2017 · Elena Ioana Vatajelu, Paolo Prinetto, et al. · IEEE Transactions on Emerging Topics in Computing · 56
STT-MRAM-Based PUF Architecture Exploiting Magnetic Tunnel Junction Fabrication-Induced Variability
2016 · Elena Ioana Vatajelu, Giorgio Di Natale, et al. · ACM Journal on Emerging Technologies in Computing Systems · 48
High-Entropy STT-MTJ-Based TRNG
2018 · Elena Ioana Vatajelu, Giorgio Di Natale · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 45
Special Session: Reliability of Hardware-Implemented Spiking Neural Networks (SNN)
2019 · Elena-Ioana Vatajelu, Giorgio Di Natale, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 43
Nonvolatile memories: Present and future challenges
2014 · Elena Ioana Vatajelu, Hassen Aziza, et al. · 42
STT MRAM-Based PUFs
2015 · Elena Ioana Vatajelu, Giorgio Di Natale, et al. · Design, Automation, and Test in Europe · 32
Test and Reliability in Approximate Computing
2018 · Lorena Anghel, Mounir Benabdenbi, et al. · Journal of Electronic Testing · 28
Security primitives (PUF and TRNG) with STT-MRAM
2016 · Elena Ioana Vatajelu, Giorgio Di Natale, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 24
Towards a Highly Reliable SRAM-based PUFs
2016 · Elena Ioana Vatajelu, Giorgio Di Natale, et al. · Design, Automation, and Test in Europe · 24
Process variability in sub-16nm bulk CMOS technology
2012 · Jose Antonio Rubio Sola, Joan Figueras Pàmies, et al. · 22
Machine learning and hardware security
2020 · Francesco Regazzoni, Shivam Bhasin, et al. · 21
On the Encryption of the Challenge in Physically Unclonable Functions
2019 · Elena Ioana Vatajelu, Giorgio Di Natale, et al. · IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) · 21
Statistical analysis of 6T SRAM data retention voltage under process variation
2011 · Elena I. Vatajelu, Joan Figueras · IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) · 17
Robustness analysis of 6T SRAMs in memory retention mode under PVT variations
2011 · E I Vatajelu, J Figueras · Design, Automation, and Test in Europe · 17
Supply voltage reduction in SRAMs: Impact on Static Noise Margins
2008 · E. I. Vatajelu, J. Figueras · IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) · 17
SRAM-Based PUF Readouts
2023 · Sergio Vinagrero, Honorio Martin, et al. · Scientific Data · 15
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State of the art and challenges for test and reliability of emerging nonvolatile resistive memories
2017 · Elena Ioana Vatajelu, Peyman Pouyan, et al. · International Journal of Circuit Theory and Applications · 15
STT-MRAM-Based Strong PUF Architecture
2015 · Elena Ioana Vatajelu, Giorgio Di Natale, et al. · IEEE Computer Society Annual Symposium on VLSI · 15
Integration of STT-MRAM model into CACTI simulator
2014 · S. Arcaro, S. Di Carlo, et al. · 15
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Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis
2010 · Elena I. Vatajelu, Georgios Panagopoulos, et al. · Proceedings/Proceedings - European Test Workshop · 14
Fully-connected single-layer STT-MTJ-based spiking neural network under process variability
2017 · Elena Ioana Vatajelu, Lorena Anghel · IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH) · 13
SEcube™: An open-source security platform in a single SoC
2016 · Antonio Varriale, Elena Ioana Vatajelu, et al. · International Conference on Design and Technology of Integrated Systems in Nanoscale Era · 13
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations
2013 · G. Tsiligiannis, Elena I. Vatajelu, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 13
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability
2013 · Elena I. Vatajelu, A. Bosio, et al. · Proceedings/Proceedings - European Test Workshop · 12
Works count: 163
Citation count: 950
H-index: 16
I10-index: 33
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