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Kenny Ong
Observed names:
K. K. Ong,
K. Ong
Institution:
GlobalFoundries (Singapore)
Observed institutions:
Nanyang Technological University,
GlobalFoundries (Singapore),
Hamburg University of Technology
OpenAlex ID:
A5071020978
Electron radiation-induced material diffusion and nanocrystallization in nanostructured amorphous CoFeB thin film
2018
·
Binghai Liu
, Taiebeh Tahmasebi
, et al.
·
Acta Materialia
·
16
Time‐of‐flight secondary ion mass spectroscopic characterization of the nitrogen profile of shallow gate oxynitride thermally grown on a silicon substrate
2012
·
Lei Zhu
, H. W. Teo
, et al.
·
Surface and Interface Analysis
·
6
Influence of the energy density on the structure and morphology of polycrystalline silicon films treated with electron beam
2006
·
L. Fu
, F. Gromball
, et al.
·
Materials Science and Engineering B
·
3
SIMS Analysis of Ultra-Shallow Boron Implant
2021
·
Han Wei Teo
, Y. Wang
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
·
2
Electron beam radiation and its impacts to failure analysis in semiconductor industry
2019
·
Binghai Liu
, Xiaoming Li
, et al.
·
Elsevier eBooks
·
2
Dependence of the relative sensitivity factor of nitrogen on various oxynitride dielectric matrixes
2013
·
Lei Zhu
, H.W. Teo
, et al.
·
Thin Solid Films
·
1
Cs+ Reactive Sputter Depth Profile for Ultrathin Metal/Metal-Oxide Composite Film Stack
2022
·
Han Wei Teo
, Yun Wang
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Multi-layered film stack models to simulate X-ray reflectivity of TaN and Ta thin films
2020
·
Ramesh Rao Nistala
, Kenny Ong
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
List of contributors
2019
·
Bey Temsamani Abdellatif
, M. Afendi
, et al.
·
Elsevier eBooks
Impact of fluorine on Idsat of field-effect transistor
2015
·
Lei Zhu
, Kenny Ong
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Idss failure investigated by SIMS profiling and TCAD simulation
2014
·
Lei Zhu
, M. B. Bai
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
An Effective SIMS Methodology for GOI Contamination Analysis
2013
·
Yanhua Huang
, Lei Zhu
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Systematic Approach for the Gate Oxide Failure Caused by Arsenic Cross Contamination
2012
·
Lei Zhu
, Huipeng Ng
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
SIMS Analysis for the Threshold Voltage Shift of Power MOS Caused by Abnormal Dopant Diffusion
2012
·
Yanhua Huang
, Lei Zhu
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Power MOSFET breakdown voltage study for process control by SIMS
2012
·
K. K. Ong
, L. Zhu
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Fast Diagnosis and Failure Mechanism of Phosphorous Contamination in Arsenic-Implanted Silicon
2011
·
Lei Zhu
, H. W. Teo
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
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Works count:
16
Citation count:
30
H-index:
3
I10-index:
1
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