Author

Seul-Ki Kang

Observed names: Kang Seulki, Seul-ki Kang, Seulki Kang
OpenAlex ID: A5071035045
2020 · Yosuke Okamoto, Shinichi Nakazawa, et al. · Metrology, Inspection, and Process Control XXXVI · 8
2021 · Yosuke Okamoto, Shinichi Nakazawa, et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 6
2023 · Benjamin D. Bunday, Shari Klotzkin, et al. · Metrology, Inspection, and Process Control XXXVI · 5
2022 · Benjamin D. Bunday, Shari Klotzkin, et al. · Metrology, Inspection, and Process Control XXXVI · 4
2023 · Seul-Ki Kang, Kotaro Maruyama, et al. · Metrology, Inspection, and Process Control XXXVI · 3
2021 · Chih-I Wei, Stewart Wu, et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 3
2020 · Sayantan Das, Seul-Ki Kang, et al. · Metrology, Inspection, and Process Control XXXVI · 3
2023 · Chih-I Wei, Seulki Kang, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 2
2021 · Seulki Kang, Kotaro Maruyama, et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 2
2016 · Seunghyun Cho, Seul-Ki Kang, et al. · Journal of the korean society of manufacturing technology engineers · 2
2023 · Chih-I Wei, Rehab K. Ali, et al. · SPIE Photomask Technology Conference
2022 · Seul-ki Kang, Yuji Miura, et al. · Metrology, Inspection, and Process Control XXXVI
2021 · Wei Chih-I, Wu Stewart, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2020 · Das S, Kang Seulki, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2017 · Seul-Ki Kang, 최윤수, et al. · Journal of the Korean Society for Library and Information Science
2016 · Park Ji-eun, Hickey Danielle Reifsnyder, et al. · Advanced Functional Materials
2014 · Dae-Kun Song, Seul-Ki Kang, et al. · Communications for Statistical Applications and Methods
2014 · Seul-Ki Kang, Hyunsoo Lee · 대한산업공학회 춘계공동학술대회 논문집
Works count: 19
Citation count: 38
H-index: 4
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