Author

Carly Rogan

Observed names: C. Rogan, Rogan, Carly
ORCID: 0009-0006-5907-7872
Observed ORCID: 0009-0006-5907-7872
OpenAlex ID: A5071043001
2023 · Kevin P. O’Brien, Carl H. Naylor, et al. · Nature Communications · 140
2021 · K. P. O'Brien, C. J. Dorow, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 118
2024 · Hubert C. George, Mateusz T. Mądzik, et al. · Nano Letters · 67
2022 · C. J. Dorow, A. Penumatcha, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 50
2022 · K. Maxey, C. H. Naylor, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 36
2023 · A. Penumatcha, K. P. O’Brien, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 26
2024 · W. Mortelmans, P. Buragohain, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 25
2024 · W. Mortelmans, P. Buragohain, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 17
2022 · Punyashloka Debashis, John J. Plombon, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 16
2025 · Kathryn Neilson, Charles Mokhtarzadeh, et al. · Nano Letters · 9
2025 · M. Jaikissoon, P. Buragohain, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 7
2025 · Mahendra DC, Keita Sakuma, et al. · Applied Physics Reviews · 3
2024 · Lida Ansari, Andrey Vyatskikh, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 3
2025 · Mahendra DC, Punyashloka Debashis, et al. · Applied Physics Letters · 2
2024 · Michael J. Eller, Brandon Holybee, et al. · Metrology, Inspection, and Process Control XXXVI
Works count: 20
Citation count: 533
H-index: 10
I10-index: 10
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